Ultrafast optical signal measurement using optoelectronic techniques

M. Yaita, T. Nagatsuma, K. Kato, K. Noguchi, H. Miyazawa, T. Otsuji

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

A novel ultrafast optical signal measurement technique is proposed that uses a fast photodetector and electrooptic (EO) sampling. The technique can satisfy three requirements for the measurement: large bandwidth, high sensitivity, and polarization independence. The measurement systems are demonstrated using two kinds of EO sampling configurations. One system uses direct EO sampling. It affords a larger bandwidth. The system can discern 100-Gbit s-1 return-to-zero (RZ) optical pulse-pattern signals with an on-off ratio of 22 dB. The other system uses a waveguide intensity modulator in EO sampling. It affords higher sesitivity and can measure an 80-Gbit s-1 RZ optical eye diagram. It is theoretically expected that the sensitivity of our system is higher than that of the all-optical technique.

Original languageEnglish
Pages (from-to)1119-1133
Number of pages15
JournalOptical and Quantum Electronics
Volume30
Issue number11-12
DOIs
Publication statusPublished - 1998
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

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