Abstract
We use ultrafast optical microscopy to investigate carrier dynamics in single flakes of atomically thin molybdenum disulfide. By tuning the probe wavelength through the bandgap, we reveal the influence of layer thickness on carrier dynamics.
Original language | English |
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Publication status | Published - 2014 |
Event | 2014 Conference on Lasers and Electro-Optics, CLEO 2014 - San Jose, United States Duration: 2014 Jun 8 → 2014 Jun 13 |
Other
Other | 2014 Conference on Lasers and Electro-Optics, CLEO 2014 |
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Country/Territory | United States |
City | San Jose |
Period | 14/6/8 → 14/6/13 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials