Two-Photon Resonant Raman Scattering in Red-Hgl2

Teruya Ishihara; Nobukata Nagasawa

doi:10.1143/JPSJ.53.2407

Two-Photon Resonant Raman Scattering in Red-Hgl₂

Teruya Ishihara, Nobukata Nagasawa

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

The two-photon resonant Raman scattering (TRRS) process via the excitonic molecule (EM) state in red-HgI2 is studied at 1.6 K. The intensity of the TRRS line is enhanced with FWHM 0.7 meV at 2.3324 eV which corresponds to a half of the EM energy. From the analysis of the TRRS data, the dispersion curve of the transverse exciton polariton is determined: The transverse exciton energy and its effective mass relative to the electron rest mass are obtained as 2.3348—0.0001 eV and 1.3 —0.1, respectively. The background dielectric constant, ∊¥, is determined to be 10.5 —0.5 from the Fabry-Perot interference fringes of a thin single crystal.

Original language	English
Pages (from-to)	2407-2410
Number of pages	4
Journal	journal of the physical society of japan
Volume	53
Issue number	7
DOIs	https://doi.org/10.1143/JPSJ.53.2407
Publication status	Published - 1984 Jan 1
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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title = "Two-Photon Resonant Raman Scattering in Red-Hgl2",

abstract = "The two-photon resonant Raman scattering (TRRS) process via the excitonic molecule (EM) state in red-HgI2 is studied at 1.6 K. The intensity of the TRRS line is enhanced with FWHM 0.7 meV at 2.3324 eV which corresponds to a half of the EM energy. From the analysis of the TRRS data, the dispersion curve of the transverse exciton polariton is determined: The transverse exciton energy and its effective mass relative to the electron rest mass are obtained as 2.3348—0.0001 eV and 1.3 —0.1, respectively. The background dielectric constant, ∊¥, is determined to be 10.5 —0.5 from the Fabry-Perot interference fringes of a thin single crystal.",

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T1 - Two-Photon Resonant Raman Scattering in Red-Hgl2

AU - Ishihara, Teruya

AU - Nagasawa, Nobukata

PY - 1984/1/1

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N2 - The two-photon resonant Raman scattering (TRRS) process via the excitonic molecule (EM) state in red-HgI2 is studied at 1.6 K. The intensity of the TRRS line is enhanced with FWHM 0.7 meV at 2.3324 eV which corresponds to a half of the EM energy. From the analysis of the TRRS data, the dispersion curve of the transverse exciton polariton is determined: The transverse exciton energy and its effective mass relative to the electron rest mass are obtained as 2.3348—0.0001 eV and 1.3 —0.1, respectively. The background dielectric constant, ∊¥, is determined to be 10.5 —0.5 from the Fabry-Perot interference fringes of a thin single crystal.

AB - The two-photon resonant Raman scattering (TRRS) process via the excitonic molecule (EM) state in red-HgI2 is studied at 1.6 K. The intensity of the TRRS line is enhanced with FWHM 0.7 meV at 2.3324 eV which corresponds to a half of the EM energy. From the analysis of the TRRS data, the dispersion curve of the transverse exciton polariton is determined: The transverse exciton energy and its effective mass relative to the electron rest mass are obtained as 2.3348—0.0001 eV and 1.3 —0.1, respectively. The background dielectric constant, ∊¥, is determined to be 10.5 —0.5 from the Fabry-Perot interference fringes of a thin single crystal.

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