Two-mode radiation from light-emitting tunnel junctions with surface roughness

K. Suzuki, J. Watanabe, A. Takeuchi, Y. Uehara, S. Ushioda

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

We have measured the angle and energy dependence of the emission intensity of light from tunnel junctions that consist of a coupler prism, glass substrate, MgF2 film, Al film, Al oxide barrier, and Au film. From junctions of this structure, two of the surface plasmon modes can emit light through the glass substrate and the prism. Strong emission occurs into the prism at approximately 43° and 67° from the surface normal, corresponding to emissions from the fast mode and the intermediate mode (Al-MgF2). The angle dependence was measured before, but this is the first time that the emission spectrum of the intermediate mode (Al-MgF2 mode) is measured. The measured angle dependence of emission can be well described by assuming a reasonable degree of interface roughness, but the emission spectra cannot be fitted well by theory.

Original languageEnglish
Pages (from-to)35-39
Number of pages5
JournalSolid State Communications
Volume69
Issue number1
DOIs
Publication statusPublished - 1989 Jan

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

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