Two-dimensional measurement of focused hard X-ray beam profile using coherent X-ray diffraction of isolated nanoparticle

Yukio Takahashi, Hideto Kubo, Ryosuke Tsutsumi, Shigeyuki Sakaki, Nobuyuki Zettsu, Yoshinori Nishino, Tetsuya Ishikawa, Kazuto Yamauchi

Research output: Contribution to journalArticlepeer-review

Abstract

A method for evaluating the two-dimensional photon density distribution in focused hard X-ray beams is proposed and demonstrated in a synchrotron experiment at SPring-8. A synchrotron X-ray beam of 11.8 keV is focused to a ∼ 1 μ m spot by Kirkpatrick-Baez mirrors. The two-dimensional intensity distribution of the focused beam is derived by monitoring the forward diffracted intensity from an isolated silver nanocube with an edge length of ∼ 150 nm positioned in the beam waist, which is two-dimensionally scanned. Furthermore, the photon density of X-rays illuminated onto the nanocube is estimated by utilizing coherent X-ray diffraction microscopy. This method is useful for evaluating the photon density distribution of hard X-ray beams focused to a spot size of less than a few micrometers.

Original languageEnglish
Pages (from-to)266-269
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume616
Issue number2-3
DOIs
Publication statusPublished - 2010 May 1
Externally publishedYes

Keywords

  • Coherent X-ray diffraction microscopy
  • Silver nanocube
  • X-ray beam diagnosis
  • X-ray mirror

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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