Two dimensional ion temperature measurement system by use of multiple line-integrated spectrums

Hiroshi Tanabe, Setthivoine You, Akihiro Kuwahata, Shingo Ito, Michiaki Inomoto, Yasushi Ono

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

The novel cost effective 2-D ion temperature measurement system was developed by use of tomographic reconstruction of 35 line-integrated spectrums on five toroidal plane. Those 5 × 7 signals were measured by a polychromator with 35 optical fibers and ICCD camera and were transformed into local line-spectrum on the r-z plane by means of the Abel inversion at each wavelength. The 2-D(r-z) profile of ion temperature on r-z plane was finally calculated from the Gaussian fitting for the local spectrums.

Original languageEnglish
Pages (from-to)772-773
Number of pages2
JournalIEEJ Transactions on Fundamentals and Materials
Volume130
Issue number8
DOIs
Publication statusPublished - 2010
Externally publishedYes

Keywords

  • Abel inversion
  • Computer tomography (CT)
  • Ion Doppler spectroscopy
  • Optical fiber
  • Plasma diagnostics

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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