Two-color reflection multilayers for He-I and He-II resonance lines for microscopic ultraviolet photoelectron spectroscopy using Schwarzschild objective

T. Ejima, Y. Kondo, M. Watanabe

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

Two-color multilayers reflecting both He-I (58.4 nm) and He-II (30.4 nm) resonance lines have been designed and fabricated as reflection coatings of mirrors of Schwarzschild objectives used for microscopic ultraviolet photoelectron spectrometers. The multilayer was designed to consist of a top single layer and piled double layers so that its normal incidence reflectances for both He-I and He-II resonance lines are more than 20%. Multilayers of SiC(top layer)-Mg/SiC(double layers) and SiC(top layer)-Y2O3/Mg (double layers) are fabricated, and their reflectances for the He-I and He-II lines are 25% and 20%, and 23% and 26%, respectively.

Original languageEnglish
Pages (from-to)376-379
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume40
Issue number1
DOIs
Publication statusPublished - 2001 Jan

Keywords

  • He resonance line
  • Mirror
  • Multilayer
  • Reflection coating
  • Ultraviolet

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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