Abstract
Two-color multilayers reflecting both He-I (58.4 nm) and He-II (30.4 nm) resonance lines have been designed and fabricated as reflection coatings of mirrors of Schwarzschild objectives used for microscopic ultraviolet photoelectron spectrometers. The multilayer was designed to consist of a top single layer and piled double layers so that its normal incidence reflectances for both He-I and He-II resonance lines are more than 20%. Multilayers of SiC(top layer)-Mg/SiC(double layers) and SiC(top layer)-Y2O3/Mg (double layers) are fabricated, and their reflectances for the He-I and He-II lines are 25% and 20%, and 23% and 26%, respectively.
| Original language | English |
|---|---|
| Pages (from-to) | 376-379 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 40 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2001 Jan |
Keywords
- He resonance line
- Mirror
- Multilayer
- Reflection coating
- Ultraviolet
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)
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Ejima, T., Kondo, Y., & Watanabe, M. (2001). Two-color reflection multilayers for He-I and He-II resonance lines for microscopic ultraviolet photoelectron spectroscopy using Schwarzschild objective. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 40(1), 376-379. https://doi.org/10.1143/JJAP.40.376