TY - GEN
T1 - Two axial shearing force measurement device with a micro displacement sensor
AU - Harisaki, Kota
AU - Takeshita, Toshihiro
AU - Iwasaki, Takuma
AU - Ando, Hideyuki
AU - Uemura, Koji
AU - Higurashi, Eiji
AU - Sawada, Renshi
N1 - Publisher Copyright:
© 2014 University of Strathclyde.
PY - 2014/10/14
Y1 - 2014/10/14
N2 - We propose a promising biaxial shearing force measurement device with an integrated micro displacement sensor (chip size of 3 mm by 3 mm and 0.7 mm in thickness) housed in an external trapezoidal metallic frame. Applying shearing force on the surface of the frame, the tilts occur on the ceiling of the frame. We can measure that tilts as a shearing force by micro displacement sensor and we obtained a linear signal response to applied biaxial shearing force. The range and sensitivity of the sensor depends on the material or thickness of the frame, therefore we can apply the sensor to various possible applications by changing its shape.
AB - We propose a promising biaxial shearing force measurement device with an integrated micro displacement sensor (chip size of 3 mm by 3 mm and 0.7 mm in thickness) housed in an external trapezoidal metallic frame. Applying shearing force on the surface of the frame, the tilts occur on the ceiling of the frame. We can measure that tilts as a shearing force by micro displacement sensor and we obtained a linear signal response to applied biaxial shearing force. The range and sensitivity of the sensor depends on the material or thickness of the frame, therefore we can apply the sensor to various possible applications by changing its shape.
UR - http://www.scopus.com/inward/record.url?scp=84908027482&partnerID=8YFLogxK
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U2 - 10.1109/OMN.2014.6924528
DO - 10.1109/OMN.2014.6924528
M3 - Conference contribution
AN - SCOPUS:84908027482
T3 - International Conference on Optical MEMS and Nanophotonics
SP - 213
EP - 214
BT - 2014 International Conference on Optical MEMS and Nanophotonics, OMN 2014 - Proceedings
PB - IEEE Computer Society
T2 - 2014 International Conference on Optical MEMS and Nanophotonics, OMN 2014
Y2 - 17 August 2014 through 21 August 2014
ER -