Twist angle dependence of Josephson junction effect measured in the [001] twist boundary of Bi2Sr2CaCu2Ox superconductor bicrystals

B. S. Xu, H. Ichinose, S. Tanaka

Research output: Contribution to journalArticle

Abstract

We present a study of the twist angle dependence of the Josephson junction effect measured in the [001] twist boundary of Bi2Sr2CaCu2Ox (S) superconductor bicrystals. Josephson junctions that have both direct (S/S) and indirect, thin silver layer (S/Ag/S) structures were fabricated by diffusion bonding of the (001) surfaces of two flaky S single crystals. A small junction area measuring 100-200 μm in diameter, was fabricated by Ar ion selective etching of one of the two thin single crystal superconductor S flakes. A 2-100-nm-thick silver layer was deposited on the (001) planes by sputtering prior to the joining of the surfaces to produce an S/Ag/S junction. It was clarified that the critical current, Ic, of the S/Ag/S junction is a function of temperature with Ic=IOH(1-T/Tc)2 for T≥0.6Tc, and Ic=IOL(-GT1/2) for T≤0.5 Tc. In these junctions, a high Ic value was obtained when the [001] twist angle θ was 23°, 28° or 37°. Our results indicated that the Josephson effect is strongly influenced by both the temperature T and the [001] twist angle θ in the S/S and S/Ag/Sjunctions.

Original languageEnglish
Pages (from-to)263-268
Number of pages6
JournalMaterials Science Forum
Volume294-296
Publication statusPublished - 1999 Jan 1

Keywords

  • Bi-Sr-Ca-Cu-O Superconductor
  • Interface
  • Josephson Junction
  • Proximity Effect
  • S/N/S
  • Weak Link

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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