TuF3.3-Experimental quantum process tomography of controlled-phase gate for time-bin qubits

Hsin Pin Lo, Takuya Ikuta, Nobuyuki Matsuda, Toshimori Honjo, William J. Munro, Hiroki Takesue

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate a controlled-phase gate for time-bin qubits using a 2 × 2 electro-optic switch based on lithium niobate waveguides. We reconstructed the process matrix using quantum process tomography with 16 distinct inputs from which we determined a process fidelity of 82%.

Original languageEnglish
Title of host publicationIEEE Photonics Society Summer Topical Meeting Series 2019, SUM 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728105970
DOIs
Publication statusPublished - 2019 Jul 1
Event2019 IEEE Photonics Society Summer Topical Meeting Series, SUM 2019 - Fort Lauderdale, United States
Duration: 2019 Jul 82019 Jul 10

Publication series

NameIEEE Photonics Society Summer Topical Meeting Series 2019, SUM 2019

Conference

Conference2019 IEEE Photonics Society Summer Topical Meeting Series, SUM 2019
CountryUnited States
CityFort Lauderdale
Period19/7/819/7/10

Keywords

  • Controlled-phase gate
  • Quantum information processing
  • Quantum logic gate
  • Time-bin qubits

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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