TuF3.3-Experimental quantum process tomography of controlled-phase gate for time-bin qubits

Hsin Pin Lo, Takuya Ikuta, Nobuyuki Matsuda, Toshimori Honjo, William J. Munro, Hiroki Takesue

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate a controlled-phase gate for time-bin qubits using a 2 × 2 electro-optic switch based on lithium niobate waveguides. We reconstructed the process matrix using quantum process tomography with 16 distinct inputs from which we determined a process fidelity of 82%.

Original languageEnglish
Title of host publicationIEEE Photonics Society Summer Topical Meeting Series 2019, SUM 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728105970
DOIs
Publication statusPublished - 2019 Jul
Event2019 IEEE Photonics Society Summer Topical Meeting Series, SUM 2019 - Fort Lauderdale, United States
Duration: 2019 Jul 82019 Jul 10

Publication series

NameIEEE Photonics Society Summer Topical Meeting Series 2019, SUM 2019

Conference

Conference2019 IEEE Photonics Society Summer Topical Meeting Series, SUM 2019
Country/TerritoryUnited States
CityFort Lauderdale
Period19/7/819/7/10

Keywords

  • Controlled-phase gate
  • Quantum information processing
  • Quantum logic gate
  • Time-bin qubits

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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