Truncating Wide Networks Using Binary Tree Architectures

Yan Zhangy, Mete Ozayy, Shuohao Li, Takayuki Okatani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we propose a binary tree architecture to truncate architecture of wide networks by reducing the width of the networks. More precisely, in the proposed architecture, the width is incrementally reduced from lower layers to higher layers in order to increase the expressive capacity of networks with a less increase on parameter size. Also, in order to ease the gradient vanishing problem, features obtained at different layers are concatenated to form the output of our architecture. By employing the proposed architecture on a baseline wide network, we can construct and train a new network with same depth but considerably less number of parameters. In our experimental analyses, we observe that the proposed architecture enables us to obtain better parameter size and accuracy trade-off compared to baseline networks using various benchmark image classification datasets. The results show that our model can decrease the classification error of a baseline from 20:43% to 19:22% on Cifar-100 using only 28% of parameters that the baseline has. Code is available at https://github.com/ZhangVision/bitnet.

Original languageEnglish
Title of host publicationProceedings - 2017 IEEE International Conference on Computer Vision, ICCV 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2116-2124
Number of pages9
ISBN (Electronic)9781538610329
DOIs
Publication statusPublished - 2017 Dec 22
Event16th IEEE International Conference on Computer Vision, ICCV 2017 - Venice, Italy
Duration: 2017 Oct 222017 Oct 29

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
Volume2017-October
ISSN (Print)1550-5499

Other

Other16th IEEE International Conference on Computer Vision, ICCV 2017
CountryItaly
CityVenice
Period17/10/2217/10/29

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition

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