True surface topography and nanomechanical mapping measurements on block copolymers with atomic force microscopy

Dong Wang; So Fujinami; Ken Nakajima; Toshio Nishi

doi:10.1021/ma9028695

True surface topography and nanomechanical mapping measurements on block copolymers with atomic force microscopy

Dong Wang, So Fujinami, Ken Nakajima, Toshio Nishi

Research output: Contribution to journal › Article › peer-review

42 Citations (Scopus)

Abstract

A quantitative method to obtain nanomechanical mapping data of poly(styrene-b-ethylene-co-butylene-b-styrene) (SEBS) triblock copolymers was studied. The samples were scanned at constant force using an E scanner and triangular Si₃N₄ cantilevers with nominal spring constant of 0.32 N/m. The specific value of periodicity distance determined by fast Fourier two-dimensional-power spectrum was 26.8 ± 2.5 nm. The sample deformation δ was calculated by subtracting the cantilever deflection Δ from the scanner displacement z (δ = z - Δ). The apparent height difference in the tapping mode height image was ~4.5 nm that revealed that the true topography should be the inverse of tapping mode height image.

Original language	English
Pages (from-to)	3169-3172
Number of pages	4
Journal	Macromolecules
Volume	43
Issue number	7
DOIs	https://doi.org/10.1021/ma9028695
Publication status	Published - 2010 Apr 13

ASJC Scopus subject areas

Organic Chemistry
Polymers and Plastics
Inorganic Chemistry
Materials Chemistry

Access to Document

10.1021/ma9028695

Cite this

@article{011c67d029ef46118aa0e287ef8d02be,

title = "True surface topography and nanomechanical mapping measurements on block copolymers with atomic force microscopy",

abstract = "A quantitative method to obtain nanomechanical mapping data of poly(styrene-b-ethylene-co-butylene-b-styrene) (SEBS) triblock copolymers was studied. The samples were scanned at constant force using an E scanner and triangular Si3N4 cantilevers with nominal spring constant of 0.32 N/m. The specific value of periodicity distance determined by fast Fourier two-dimensional-power spectrum was 26.8 ± 2.5 nm. The sample deformation δ was calculated by subtracting the cantilever deflection Δ from the scanner displacement z (δ = z - Δ). The apparent height difference in the tapping mode height image was ~4.5 nm that revealed that the true topography should be the inverse of tapping mode height image.",

author = "Dong Wang and So Fujinami and Ken Nakajima and Toshio Nishi",

year = "2010",

month = apr,

day = "13",

doi = "10.1021/ma9028695",

language = "English",

volume = "43",

pages = "3169--3172",

journal = "Macromolecules",

issn = "0024-9297",

publisher = "American Chemical Society",

number = "7",

}

TY - JOUR

T1 - True surface topography and nanomechanical mapping measurements on block copolymers with atomic force microscopy

AU - Wang, Dong

AU - Fujinami, So

AU - Nakajima, Ken

AU - Nishi, Toshio

PY - 2010/4/13

Y1 - 2010/4/13

N2 - A quantitative method to obtain nanomechanical mapping data of poly(styrene-b-ethylene-co-butylene-b-styrene) (SEBS) triblock copolymers was studied. The samples were scanned at constant force using an E scanner and triangular Si3N4 cantilevers with nominal spring constant of 0.32 N/m. The specific value of periodicity distance determined by fast Fourier two-dimensional-power spectrum was 26.8 ± 2.5 nm. The sample deformation δ was calculated by subtracting the cantilever deflection Δ from the scanner displacement z (δ = z - Δ). The apparent height difference in the tapping mode height image was ~4.5 nm that revealed that the true topography should be the inverse of tapping mode height image.

AB - A quantitative method to obtain nanomechanical mapping data of poly(styrene-b-ethylene-co-butylene-b-styrene) (SEBS) triblock copolymers was studied. The samples were scanned at constant force using an E scanner and triangular Si3N4 cantilevers with nominal spring constant of 0.32 N/m. The specific value of periodicity distance determined by fast Fourier two-dimensional-power spectrum was 26.8 ± 2.5 nm. The sample deformation δ was calculated by subtracting the cantilever deflection Δ from the scanner displacement z (δ = z - Δ). The apparent height difference in the tapping mode height image was ~4.5 nm that revealed that the true topography should be the inverse of tapping mode height image.

UR - http://www.scopus.com/inward/record.url?scp=77951544521&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77951544521&partnerID=8YFLogxK

U2 - 10.1021/ma9028695

DO - 10.1021/ma9028695

M3 - Article

AN - SCOPUS:77951544521

VL - 43

SP - 3169

EP - 3172

JO - Macromolecules

JF - Macromolecules

SN - 0024-9297

IS - 7

ER -

True surface topography and nanomechanical mapping measurements on block copolymers with atomic force microscopy

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this