True surface topography and nanomechanical mapping measurements on block copolymers with atomic force microscopy

Dong Wang, So Fujinami, Ken Nakajima, Toshio Nishi

    Research output: Contribution to journalArticlepeer-review

    38 Citations (Scopus)

    Abstract

    A quantitative method to obtain nanomechanical mapping data of poly(styrene-b-ethylene-co-butylene-b-styrene) (SEBS) triblock copolymers was studied. The samples were scanned at constant force using an E scanner and triangular Si3N4 cantilevers with nominal spring constant of 0.32 N/m. The specific value of periodicity distance determined by fast Fourier two-dimensional-power spectrum was 26.8 ± 2.5 nm. The sample deformation δ was calculated by subtracting the cantilever deflection Δ from the scanner displacement z (δ = z - Δ). The apparent height difference in the tapping mode height image was ~4.5 nm that revealed that the true topography should be the inverse of tapping mode height image.

    Original languageEnglish
    Pages (from-to)3169-3172
    Number of pages4
    JournalMacromolecules
    Volume43
    Issue number7
    DOIs
    Publication statusPublished - 2010 Apr 13

    ASJC Scopus subject areas

    • Organic Chemistry
    • Polymers and Plastics
    • Inorganic Chemistry
    • Materials Chemistry

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