True surface topography and nanomechanical mapping measurements on block copolymers with atomic force microscopy

Dong Wang; So Fujinami; Ken Nakajima; Toshio Nishi

doi:10.1021/ma9028695

True surface topography and nanomechanical mapping measurements on block copolymers with atomic force microscopy

Dong Wang, So Fujinami, Ken Nakajima, Toshio Nishi

Research output: Contribution to journal › Article › peer-review

38 Citations (Scopus)

Abstract

A quantitative method to obtain nanomechanical mapping data of poly(styrene-b-ethylene-co-butylene-b-styrene) (SEBS) triblock copolymers was studied. The samples were scanned at constant force using an E scanner and triangular Si₃N₄ cantilevers with nominal spring constant of 0.32 N/m. The specific value of periodicity distance determined by fast Fourier two-dimensional-power spectrum was 26.8 ± 2.5 nm. The sample deformation δ was calculated by subtracting the cantilever deflection Δ from the scanner displacement z (δ = z - Δ). The apparent height difference in the tapping mode height image was ~4.5 nm that revealed that the true topography should be the inverse of tapping mode height image.

Original language	English
Pages (from-to)	3169-3172
Number of pages	4
Journal	Macromolecules
Volume	43
Issue number	7
DOIs	https://doi.org/10.1021/ma9028695
Publication status	Published - 2010 Apr 13

ASJC Scopus subject areas

Organic Chemistry
Polymers and Plastics
Inorganic Chemistry
Materials Chemistry

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abstract = "A quantitative method to obtain nanomechanical mapping data of poly(styrene-b-ethylene-co-butylene-b-styrene) (SEBS) triblock copolymers was studied. The samples were scanned at constant force using an E scanner and triangular Si3N4 cantilevers with nominal spring constant of 0.32 N/m. The specific value of periodicity distance determined by fast Fourier two-dimensional-power spectrum was 26.8 ± 2.5 nm. The sample deformation δ was calculated by subtracting the cantilever deflection Δ from the scanner displacement z (δ = z - Δ). The apparent height difference in the tapping mode height image was ~4.5 nm that revealed that the true topography should be the inverse of tapping mode height image.",

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AU - Wang, Dong

AU - Fujinami, So

AU - Nakajima, Ken

AU - Nishi, Toshio

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AB - A quantitative method to obtain nanomechanical mapping data of poly(styrene-b-ethylene-co-butylene-b-styrene) (SEBS) triblock copolymers was studied. The samples were scanned at constant force using an E scanner and triangular Si3N4 cantilevers with nominal spring constant of 0.32 N/m. The specific value of periodicity distance determined by fast Fourier two-dimensional-power spectrum was 26.8 ± 2.5 nm. The sample deformation δ was calculated by subtracting the cantilever deflection Δ from the scanner displacement z (δ = z - Δ). The apparent height difference in the tapping mode height image was ~4.5 nm that revealed that the true topography should be the inverse of tapping mode height image.

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True surface topography and nanomechanical mapping measurements on block copolymers with atomic force microscopy

Abstract

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