Abstract
A quantitative method to obtain nanomechanical mapping data of poly(styrene-b-ethylene-co-butylene-b-styrene) (SEBS) triblock copolymers was studied. The samples were scanned at constant force using an E scanner and triangular Si3N4 cantilevers with nominal spring constant of 0.32 N/m. The specific value of periodicity distance determined by fast Fourier two-dimensional-power spectrum was 26.8 ± 2.5 nm. The sample deformation δ was calculated by subtracting the cantilever deflection Δ from the scanner displacement z (δ = z - Δ). The apparent height difference in the tapping mode height image was ~4.5 nm that revealed that the true topography should be the inverse of tapping mode height image.
Original language | English |
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Pages (from-to) | 3169-3172 |
Number of pages | 4 |
Journal | Macromolecules |
Volume | 43 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2010 Apr 13 |
ASJC Scopus subject areas
- Organic Chemistry
- Polymers and Plastics
- Inorganic Chemistry
- Materials Chemistry