Transport of heavily boron-doped synthetic semiconductor diamond in the hopping regime

Toshimaro Sato, Kazutoshi Ohashi, Hiroyuki Sugai

Research output: Contribution to journalArticlepeer-review

56 Citations (Scopus)


We report electrical transport measurements of synthetic diamonds doped with boron about 100 ppm. The resistivity has been measured in the temperature range 20-300 K by the van der Pauw method. We have also investigated infrared absorption coefficient at room temperature. Furthermore, we have studied the effect of (Formula presented) ion irradiations with 150 MeV which introduce donor defects and also the influence of the annealing after the irradiation. The key features of the present measurement are as follows: (i) The observed temperature dependence of resistivity shows characteristic features of the variable-range-hopping (VRH). A crossover from (Formula presented) behavior of Mott VRH to the (Formula presented) form of Efros VRH is found to occur at 100 K. (ii) Below 50 K we have observed the hard gap (Formula presented) form. The width of the hard gap is about 10 meV. (iii) The experimental results are quantitatively explained by the theory of VRH. (iv) The observed width of the optical hard gap is equal to that of the hard gap obtained from resistivity. (v) The annealing effects appear only in the hard gap region and do not appear in the variable-range-hopping region. This result leads to the speculation that the hard gap is weakened by the lattice defects.

Original languageEnglish
Pages (from-to)12970-12976
Number of pages7
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number19
Publication statusPublished - 2000
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


Dive into the research topics of 'Transport of heavily boron-doped synthetic semiconductor diamond in the hopping regime'. Together they form a unique fingerprint.

Cite this