Transmission electron microscopy study of thermal barrier coatings fabricated by electron beam-physical vapor deposition

Takeharu Kato, Kazuhide Matsumoto, Yutaka Ishiwata, Tsukasa Hirayama, Hideaki Matsubara, Yuichi Ikuhara, Hiroyasu Saka

Research output: Contribution to journalConference articlepeer-review

Abstract

Yttria stabilized zirconia (YSZ) film was deposited on to a stationary metal substrate by electron beam-physical vapor deposition (EB-PVD) at 850°C. The film was characterized using transmission electron microscopy and scanning electron microscopy. The film was composed of inverted triangular-based pyramidal grains (T-grains) and inverted diamond-based pyramidal grains (D-grains). The T-grains were aligned in the 〈111〉 direction and D-grains in 〈110〉 perpendicularly to the substrate. Furthermore, striated lines of nano-pores, which should be strongly related to the thermal conductivity of the film, were observed in each YSZ grain. The pores were oriented in the 〈110〉 in the (111) plane and distributed across {114̄} planes in the YSZ grains aligned in the 〈111〉 (T-grains). In the YSZ grain aligned in the 〈110〉 (D-grains), the pores were oriented in the [1̄10] and the [001] directions in the (110) and distributed across the (001) and (1̄10).

Original languageEnglish
Pages (from-to)2877-2882
Number of pages6
JournalMaterials Science Forum
Volume475-479
Issue numberIV
DOIs
Publication statusPublished - 2005 Jan 1
EventPRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China
Duration: 2004 Nov 22004 Nov 5

Keywords

  • EB-PVD
  • FIB
  • Nano-pores
  • TBC
  • TEM

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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