Transient analysis of em radiation associated with information leakage from cryptographic ICs

Yu-Ichi Hayashi, Naofumi Homma, Takafumi Aoki, Yuichiro Okugawa, Yoshiharu Akiyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper presents a time-domain visualization method for tracing electromagnetic (EM) radiation associated with information leakage from cryptographic ICs on the printed circuit board (PCB) surface. In recent years, security threats based on EM analysis attacks on cryptographic devices are attracting considerable attention due to their relative simplicity in practice. Some of the most cost-effective countermeasures against such attacks can be implemented at the PCB level. In order to implement such countermeasures effectively, critical parts (i.e., information sources and information propagation paths) on the board should be identified in advance. The key idea behind this identification is to calculate a correlation between measured EM traces and EM intensity values estimated from correct information (secret key) in the time domain. Transient analysis can reveal information propagation paths even if the EM signal carrying information is weak in comparison with noise generated from other components. Through an experiment, we confirm that EM radiation associated with information leakage can be traced even in situations where the information signal is obscured by background noise.

Original languageEnglish
Title of host publicationEMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits
PublisherIEEE Computer Society
Pages78-82
Number of pages5
ISBN (Print)9781479923151
DOIs
Publication statusPublished - 2013 Jan 1
Event9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013 - Nara, Japan
Duration: 2013 Dec 152013 Dec 18

Publication series

NameEMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits

Other

Other9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2013
CountryJapan
CityNara
Period13/12/1513/12/18

Keywords

  • Cryptographic IC
  • Electromagnetic radiation
  • Information leakage
  • Side-chennel attack
  • Transient analysis

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Transient analysis of em radiation associated with information leakage from cryptographic ICs'. Together they form a unique fingerprint.

Cite this