The total reflection X-ray photoelectron spectra of copper phthalocyanine-gold multilayers on a Si wafer were measured and compared with calculated C1s photoelectron peak intensity. The agreement between experiment and calculation was satisfactory despite the crude model used in the calculation. The island structure of evaporated gold was also observed in the angle dependent C1s photoelectron intensity.
- Surface analysis
- Surface layer analysis
- X-ray photoelectron spectroscopy
- X-ray total reflection
ASJC Scopus subject areas
- Analytical Chemistry
- Atomic and Molecular Physics, and Optics