Total reflection X-ray photoelectron spectroscopy of copper phthalocyanine-gold multilayers

Jun Kawai, Hiroyuki Amano, Kouichi Hayashi, Toshihisa Horiuchi, Kazumi Matsushige, Yoshinori Kitajima

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)


The total reflection X-ray photoelectron spectra of copper phthalocyanine-gold multilayers on a Si wafer were measured and compared with calculated C1s photoelectron peak intensity. The agreement between experiment and calculation was satisfactory despite the crude model used in the calculation. The island structure of evaporated gold was also observed in the angle dependent C1s photoelectron intensity.

Original languageEnglish
Pages (from-to)873-879
Number of pages7
JournalSpectrochimica Acta - Part B Atomic Spectroscopy
Issue number7
Publication statusPublished - 1997 Jul 1
Externally publishedYes


  • Surface analysis
  • Surface layer analysis
  • X-ray photoelectron spectroscopy
  • X-ray total reflection

ASJC Scopus subject areas

  • Analytical Chemistry
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Spectroscopy


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