Total reflection X-ray fluorescence analysis with chemical microchip

Kouichi Tsuji, Yousuke Hanaoka, Akihide Hibara, Manabu Tokeshi, Takehiko Kitamori

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


A chemical microchip, which has a flat region on the surface, was recently designed for total reflection X-ray fluorescence (TXRF) analysis. A sample solution was introduced from an inlet by a microsyringe and flowed into a microchannel. Finally it overflowed from the well-type microchannel on the flat region. The sample solution on this region was dried, and then measured by TXRF. The TXRF spectra could be measured with a low background level. This preliminary result indicated that the edge of the well-type channel would not cause a serious problem for TXRF analysis. In addition, a good linear relationship was obtained for Zn Kα in Zn standard solution. This suggests that quantitative analysis by TXRF is feasible in combination with a chemical microchip.

Original languageEnglish
Pages (from-to)389-392
Number of pages4
JournalSpectrochimica Acta - Part B Atomic Spectroscopy
Issue number4
Publication statusPublished - 2006 Apr
Externally publishedYes


  • Chemical microchip
  • Microchannel
  • TXRF

ASJC Scopus subject areas

  • Analytical Chemistry
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Spectroscopy


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