Total reflection X-ray fluorescence analysis with chemical microchip

Kouichi Tsuji; Yousuke Hanaoka; Akihide Hibara; Manabu Tokeshi; Takehiko Kitamori

doi:10.1016/j.sab.2006.01.015

Total reflection X-ray fluorescence analysis with chemical microchip

Kouichi Tsuji, Yousuke Hanaoka, Akihide Hibara, Manabu Tokeshi, Takehiko Kitamori

Research output: Contribution to journal › Article

6 Citations (Scopus)

Abstract

A chemical microchip, which has a flat region on the surface, was recently designed for total reflection X-ray fluorescence (TXRF) analysis. A sample solution was introduced from an inlet by a microsyringe and flowed into a microchannel. Finally it overflowed from the well-type microchannel on the flat region. The sample solution on this region was dried, and then measured by TXRF. The TXRF spectra could be measured with a low background level. This preliminary result indicated that the edge of the well-type channel would not cause a serious problem for TXRF analysis. In addition, a good linear relationship was obtained for Zn Kα in Zn standard solution. This suggests that quantitative analysis by TXRF is feasible in combination with a chemical microchip.

Original language	English
Pages (from-to)	389-392
Number of pages	4
Journal	Spectrochimica Acta - Part B Atomic Spectroscopy
Volume	61
Issue number	4
DOIs	https://doi.org/10.1016/j.sab.2006.01.015
Publication status	Published - 2006 Apr 1
Externally published	Yes

Keywords

Chemical microchip
Microchannel
TXRF

ASJC Scopus subject areas

Analytical Chemistry
Atomic and Molecular Physics, and Optics
Instrumentation
Spectroscopy

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Tsuji, K., Hanaoka, Y., Hibara, A., Tokeshi, M., & Kitamori, T. (2006). Total reflection X-ray fluorescence analysis with chemical microchip. Spectrochimica Acta - Part B Atomic Spectroscopy, 61(4), 389-392. https://doi.org/10.1016/j.sab.2006.01.015

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abstract = "A chemical microchip, which has a flat region on the surface, was recently designed for total reflection X-ray fluorescence (TXRF) analysis. A sample solution was introduced from an inlet by a microsyringe and flowed into a microchannel. Finally it overflowed from the well-type microchannel on the flat region. The sample solution on this region was dried, and then measured by TXRF. The TXRF spectra could be measured with a low background level. This preliminary result indicated that the edge of the well-type channel would not cause a serious problem for TXRF analysis. In addition, a good linear relationship was obtained for Zn Kα in Zn standard solution. This suggests that quantitative analysis by TXRF is feasible in combination with a chemical microchip.",

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AU - Hanaoka, Yousuke

AU - Hibara, Akihide

AU - Tokeshi, Manabu

AU - Kitamori, Takehiko

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