TOF-SIMS imaging of polyester/melamine resin with bismuth cluster ions

S. Nishinomiya; K. Toshin; R. Shishido; S. Suzuki

doi:10.1002/sia.6087

TOF-SIMS imaging of polyester/melamine resin with bismuth cluster ions

S. Nishinomiya, K. Toshin, R. Shishido, S. Suzuki

Division of Inorganic Material Research

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

In recent years, secondary ion mass spectrometry (SIMS) with a time-of-flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF-SIMS with a cluster ion beam (Au_n, Bi_n, C₆₀, Ar_n, etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF-SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C₅H₇N₆ ⁺ (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst.

Original language	English
Pages (from-to)	1114-1118
Number of pages	5
Journal	Surface and Interface Analysis
Volume	48
Issue number	11
DOIs	https://doi.org/10.1002/sia.6087
Publication status	Published - 2016 Nov 1

Keywords

Bi-cluster
SIMS
melamine self-condensation
paint film

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1002/sia.6087

Cite this

@article{5a07c5c1fcde4c39989863d53d0b6422,

title = "TOF-SIMS imaging of polyester/melamine resin with bismuth cluster ions",

abstract = "In recent years, secondary ion mass spectrometry (SIMS) with a time-of-flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF-SIMS with a cluster ion beam (Aun, Bin, C60, Arn, etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF-SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C5H7N6 + (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst.",

keywords = "Bi-cluster, SIMS, melamine self-condensation, paint film",

author = "S. Nishinomiya and K. Toshin and R. Shishido and S. Suzuki",

year = "2016",

month = nov,

day = "1",

doi = "10.1002/sia.6087",

language = "English",

volume = "48",

pages = "1114--1118",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley and Sons Ltd",

number = "11",

}

TY - JOUR

T1 - TOF-SIMS imaging of polyester/melamine resin with bismuth cluster ions

AU - Nishinomiya, S.

AU - Toshin, K.

AU - Shishido, R.

AU - Suzuki, S.

PY - 2016/11/1

Y1 - 2016/11/1

N2 - In recent years, secondary ion mass spectrometry (SIMS) with a time-of-flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF-SIMS with a cluster ion beam (Aun, Bin, C60, Arn, etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF-SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C5H7N6 + (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst.

AB - In recent years, secondary ion mass spectrometry (SIMS) with a time-of-flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF-SIMS with a cluster ion beam (Aun, Bin, C60, Arn, etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF-SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C5H7N6 + (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst.

KW - Bi-cluster

KW - SIMS

KW - melamine self-condensation

KW - paint film

UR - http://www.scopus.com/inward/record.url?scp=84980047862&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84980047862&partnerID=8YFLogxK

U2 - 10.1002/sia.6087

DO - 10.1002/sia.6087

M3 - Article

AN - SCOPUS:84980047862

VL - 48

SP - 1114

EP - 1118

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 11

ER -

TOF-SIMS imaging of polyester/melamine resin with bismuth cluster ions

Abstract

Keywords

ASJC Scopus subject areas

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