TOF-SIMS imaging of polyester/melamine resin with bismuth cluster ions

S. Nishinomiya, K. Toshin, R. Shishido, S. Suzuki

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

In recent years, secondary ion mass spectrometry (SIMS) with a time-of-flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF-SIMS with a cluster ion beam (Aun, Bin, C60, Arn, etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF-SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C5H7N6 + (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst.

Original languageEnglish
Pages (from-to)1114-1118
Number of pages5
JournalSurface and Interface Analysis
Volume48
Issue number11
DOIs
Publication statusPublished - 2016 Nov 1

Keywords

  • Bi-cluster
  • SIMS
  • melamine self-condensation
  • paint film

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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