Time-resolved X-ray reflectometry in the multiwavelength dispersive geometry

Tadashi Matsushita, Etsuo Arakawa, Tetsuo Harada, Tadashi Hatano, Yasuo Higashi, Yohko F. Yano, Yasuhiro Niwa, Yasuhiro Inada, Shusaku Nagano, Takahiro Seki

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)

    Abstract

    A new method of measuring specular X-ray reflectivity curves with a time resolution of milliseconds to seconds is developed. A horizontally convergent X-ray beam having a one-to-one correlation between its direction and energy is realized by a curved crystal or a laterally graded multilayer on an elliptic substrate. The X-ray beam is then incident on the surface of the specimen placed at the focus in such a way that the glancing angle in the vertical direction is the same for all X-ray components, which are reflected in the vertical direction by the surface and diverge in the horizontal plane. The perpendicular momentum transfer continuously changes as a function of the horizontal ray direction since the wavelength change similarly. The normalized linear intensity distribution across the beam direction measured downstream of the specimen represents the X-ray reflectivity curve. Examples of time-resolved measurements of X-ray reflectivity curves are shown.

    Original languageEnglish
    Title of host publicationSRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation
    Pages927-930
    Number of pages4
    DOIs
    Publication statusPublished - 2010
    Event10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia
    Duration: 2009 Sep 272009 Oct 2

    Publication series

    NameAIP Conference Proceedings
    Volume1234
    ISSN (Print)0094-243X
    ISSN (Electronic)1551-7616

    Other

    Other10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009
    Country/TerritoryAustralia
    CityMelbourne, VIC
    Period09/9/2709/10/2

    Keywords

    • multi-wavelength dispersive
    • time-resolved X-ray reflectivity

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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