Time-resolved X-ray reflectometry in the multiwavelength dispersive geometry

Tadashi Matsushita, Etsuo Arakawa, Tetsuo Harada, Tadashi Hatano, Yasuo Higashi, Yohko F. Yano, Yasuhiro Niwa, Yasuhiro Inada, Shusaku Nagano, Takahiro Seki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)


A new method of measuring specular X-ray reflectivity curves with a time resolution of milliseconds to seconds is developed. A horizontally convergent X-ray beam having a one-to-one correlation between its direction and energy is realized by a curved crystal or a laterally graded multilayer on an elliptic substrate. The X-ray beam is then incident on the surface of the specimen placed at the focus in such a way that the glancing angle in the vertical direction is the same for all X-ray components, which are reflected in the vertical direction by the surface and diverge in the horizontal plane. The perpendicular momentum transfer continuously changes as a function of the horizontal ray direction since the wavelength change similarly. The normalized linear intensity distribution across the beam direction measured downstream of the specimen represents the X-ray reflectivity curve. Examples of time-resolved measurements of X-ray reflectivity curves are shown.

Original languageEnglish
Title of host publicationSRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation
Number of pages4
Publication statusPublished - 2010
Event10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia
Duration: 2009 Sep 272009 Oct 2

Publication series

NameAIP Conference Proceedings
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616


Other10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009
CityMelbourne, VIC


  • multi-wavelength dispersive
  • time-resolved X-ray reflectivity

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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