TY - JOUR
T1 - Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser
AU - Tanaka, Yoshihito
AU - Ito, Kiminori
AU - Nakatani, Takashi
AU - Onitsuka, Rena
AU - Newton, Marcus
AU - Sato, Takahiro
AU - Togashi, Tadashi
AU - Yabashi, Makina
AU - Kawaguchi, Tomoya
AU - Shimada, Koki
AU - Tokuda, Kazuya
AU - Takahashi, Isao
AU - Ichitsubo, Tetsu
AU - Matsubara, Eiichiro
AU - Nishino, Yoshinori
PY - 2013/3
Y1 - 2013/3
N2 - Ultrafast time-resolved Bragg coherent X-ray diffraction (CXD) has been performed to investigate lattice dynamics in a thin crystal layer with a nanoscale thickness by using a SASE (Self-Amplified Spontaneous Emission)-XFEL (X-ray Free Electron Laser) facility, SACLA. Single-shot Bragg coherent diffraction patterns of a 100nm-thick silicon crystal were measured in the asymmetric configuration with a grazing exit using an area detector. The measured coherent diffraction patterns showed fringes extending in the surface normal direction. By using an optical femtosecond laser-pump and the XFEL-probe, a transient broadening of coherent diffraction pattern profile was observed at a delay time of around a few tens of picosecond, indicating transient crystal lattice fluctuation induced by the optical laser. A perspective application of the time-resolved Bragg CXD method to investigate small sized grains composing ceramic materials is discussed.
AB - Ultrafast time-resolved Bragg coherent X-ray diffraction (CXD) has been performed to investigate lattice dynamics in a thin crystal layer with a nanoscale thickness by using a SASE (Self-Amplified Spontaneous Emission)-XFEL (X-ray Free Electron Laser) facility, SACLA. Single-shot Bragg coherent diffraction patterns of a 100nm-thick silicon crystal were measured in the asymmetric configuration with a grazing exit using an area detector. The measured coherent diffraction patterns showed fringes extending in the surface normal direction. By using an optical femtosecond laser-pump and the XFEL-probe, a transient broadening of coherent diffraction pattern profile was observed at a delay time of around a few tens of picosecond, indicating transient crystal lattice fluctuation induced by the optical laser. A perspective application of the time-resolved Bragg CXD method to investigate small sized grains composing ceramic materials is discussed.
KW - Coherent X-ray diffraction
KW - Nanocrystal
KW - Semiconductor
KW - Time-resolved measurement
KW - X-ray free electron laser
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U2 - 10.2109/jcersj2.121.283
DO - 10.2109/jcersj2.121.283
M3 - Article
AN - SCOPUS:84874887035
VL - 121
SP - 283
EP - 286
JO - Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan
JF - Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan
SN - 1882-0743
IS - 1411
ER -