Time-of-flight spectroscopy of positronium emission from SiO2 surface

Y. Morinaka, Y. Nagashima, Y. Nagai, T. Hyodo, T. Kurihara, T. Shidara, K. Nakahara

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

The time-of-flight of positronium emitted from single crystal and amorphous SiO2 has been measured using a high-intensity pulsed positron beam at KEK. For the both samples, two components, of peak energies around 1eV and 3eV, have been observed.

Original languageEnglish
Pages (from-to)689-691
Number of pages3
JournalMaterials Science Forum
Volume255-257
Publication statusPublished - 1997 Jan 1
Externally publishedYes

Keywords

  • Positron Beam
  • Positronium Emission
  • SiO
  • TOF
  • Work Function

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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  • Cite this

    Morinaka, Y., Nagashima, Y., Nagai, Y., Hyodo, T., Kurihara, T., Shidara, T., & Nakahara, K. (1997). Time-of-flight spectroscopy of positronium emission from SiO2 surface. Materials Science Forum, 255-257, 689-691.