TIME-OF-FLIGHT ATOM-PROBE STUDY OF A W-Zr FIELD EMITTER.

Toshio Sakurai, Y. Kuk

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Abstract

    A high-performance time-of-flight atomprobe was employed successfully in the composition analysis of zirconiated tungsten field emitters. Surface compositions were analyzed in situ under various emitter surface conditions with a mass resolution (m/ DELTA m) greater than equivalent to 2000. The study showed that nitrogen, instead of oxygen, may play a dominant role in the surface reaction and causes the building of pure tungsten in the (100) plane.

    Original languageEnglish
    Title of host publicationProceedings - The Electrochemical Society
    PublisherElectrochem Soc Inc
    Pages68-72
    Number of pages5
    Volume80-6
    Publication statusPublished - 1980
    EventProc on the Symp on Electron and Ion Beam Sci and Technol, 9th Int Conf - St Louis, MO, USA
    Duration: 1980 May 111980 May 16

    Other

    OtherProc on the Symp on Electron and Ion Beam Sci and Technol, 9th Int Conf
    CitySt Louis, MO, USA
    Period80/5/1180/5/16

    ASJC Scopus subject areas

    • Engineering(all)

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