TY - JOUR
T1 - Threshold behaviour of the multiply-charged photoion yields near the ar k edge
AU - Ueda, K.
AU - Shigemasa, E.
AU - Sato, Y.
AU - Yagishita, A.
AU - Ukait, M.
AU - Maezawa, H.
AU - Hayaishi, T.
AU - Sasaki, T.
PY - 1991/2/14
Y1 - 1991/2/14
N2 - We have measured yield curves of the multiply-charged ions produced by the photoexcitation in the vicinity of the Ar K-shell ionization threshold using monochromat- ized undulator radiation and a time-of-flight mass spectrometer. The charge distribution of the multiply-charged Ar ions produced by the K-shell excitation suggests that both the electron in the outer shell and the excited Rydberg electron are shaken off with high probability during successive electronic relaxation processes. Post-collision interaction effects are also seen at the photon energies just above the K threshold. The fluorescence yield for the K hole is estimated to be 0.135 ±0.03 from the charge distribution above the K threshold.
AB - We have measured yield curves of the multiply-charged ions produced by the photoexcitation in the vicinity of the Ar K-shell ionization threshold using monochromat- ized undulator radiation and a time-of-flight mass spectrometer. The charge distribution of the multiply-charged Ar ions produced by the K-shell excitation suggests that both the electron in the outer shell and the excited Rydberg electron are shaken off with high probability during successive electronic relaxation processes. Post-collision interaction effects are also seen at the photon energies just above the K threshold. The fluorescence yield for the K hole is estimated to be 0.135 ±0.03 from the charge distribution above the K threshold.
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U2 - 10.1088/0953-4075/24/3/016
DO - 10.1088/0953-4075/24/3/016
M3 - Article
AN - SCOPUS:0242686701
VL - 24
SP - 605
EP - 613
JO - Journal of Physics B: Atomic, Molecular and Optical Physics
JF - Journal of Physics B: Atomic, Molecular and Optical Physics
SN - 0953-4075
IS - 3
ER -