Threshold behaviour of the multiply-charged photoion yields near the ar k edge

K. Ueda, E. Shigemasa, Y. Sato, A. Yagishita, M. Ukait, H. Maezawa, T. Hayaishi, T. Sasaki

Research output: Contribution to journalArticlepeer-review

53 Citations (Scopus)

Abstract

We have measured yield curves of the multiply-charged ions produced by the photoexcitation in the vicinity of the Ar K-shell ionization threshold using monochromat- ized undulator radiation and a time-of-flight mass spectrometer. The charge distribution of the multiply-charged Ar ions produced by the K-shell excitation suggests that both the electron in the outer shell and the excited Rydberg electron are shaken off with high probability during successive electronic relaxation processes. Post-collision interaction effects are also seen at the photon energies just above the K threshold. The fluorescence yield for the K hole is estimated to be 0.135 ±0.03 from the charge distribution above the K threshold.

Original languageEnglish
Pages (from-to)605-613
Number of pages9
JournalJournal of Physics B: Atomic, Molecular and Optical Physics
Volume24
Issue number3
DOIs
Publication statusPublished - 1991 Feb 14

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics

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