Three-dimensional structural analysis of rubber materials using scanning electron microscopy equipped with focused ion beam

Mitsuro Kato, Ito Toshihiko, Yoshitaka Aoyama, Koji Sawa, Takeshi Kaneko, Noboru Kawase, Hiroshi Jinnai

Research output: Contribution to conferencePaperpeer-review

Abstract

A 3D lamellar structure of a poly(styrene-block-isoprene) block copolymer has been studied at the sub-micrometer and micrometer scale by a scanning electron microscope equipped with a focused ion beam system (FIB-SEM). The specimen, stained by an OsO4 water solution, was fabricated by the Ga ion beam with the suitable acceleration voltage (30 kV) and was observed by the electron beam with the optimized acceleration voltage (1.6 kV). These experimental conditions enabled us to take clear SEM images without significant beam damages, and the 3D lamellar structure of the SI block copolymer was successfully reconstructed. The size of reconstructed image by the FIB-SEM was 6.0 × 6.0 × 4.0 μ,m3, which was larger than the transmission electron microtomograhy data, 3.8 × 3.9 × 0.24 μm3 by a factor of ca. 40. The result indicates that 3D reconstruction by means of FIB-SEM is quite useful for 3D direct observations and analyses of polymeric materials at the sub-micrometer and micrometer scale.

Original languageEnglish
Pages3341-3342
Number of pages2
Publication statusPublished - 2006 Dec 1
Externally publishedYes
Event55th Society of Polymer Science Japan Symposium on Macromolecules - Toyama, Japan
Duration: 2006 Sep 202006 Sep 22

Other

Other55th Society of Polymer Science Japan Symposium on Macromolecules
CountryJapan
CityToyama
Period06/9/2006/9/22

Keywords

  • Electron tomography
  • Focused ion beam (FIB)
  • Rubber materials
  • Scanning electron microscope (SEM)
  • Sub-micrometer and micrometer scale morphologies
  • Three-dimensional (3D) reconstruction

ASJC Scopus subject areas

  • Engineering(all)

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