Abstract
Dual-beam focused ion beam system (DB-FIB) has been used to study three-dimensional (3D) structure of a poly(styrene-block-isoprene) (SI) block copolymer with domain spacing of ca. 0.1 μm, which isn't adequately observed in 3D by transmission electron microtomography (TEMT). In polymeric materials, in contrast to metals and semiconductor materials, it is difficult to obtain a series of SEM images that indicates the internal structure accurately, because of heat damage and electrostatic charge of the specimen. In the present study, the specimen, stained by 5% OsO4 for a week and applied Pt evaporation coating and Pt deposition, was fabricated (accelerating voltage of FIB; 30 kV) and observed (accelerating voltage of SEM; 1.6 kV). This condition enabled us to take clear SEM images, and resulted in a reconstruction of 3D structure of SI lamellae with domain spacing of 0.10 μm.
Original language | English |
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Number of pages | 1 |
Publication status | Published - 2006 Oct 18 |
Externally published | Yes |
Event | 55th SPSJ Annual Meeting - Nagoya, Japan Duration: 2006 May 24 → 2006 May 26 |
Other
Other | 55th SPSJ Annual Meeting |
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Country/Territory | Japan |
City | Nagoya |
Period | 06/5/24 → 06/5/26 |
Keywords
- Block copolymer
- Dual-beam focused ion beam (DB-FIB)
- Electron tomography
ASJC Scopus subject areas
- Engineering(all)