Abstract
Coherent diffraction microscopy using highly focused hard X-ray beams allows us to three-dimensionally observe thick objects with a high spatial resolution, also providing us with unique structural information, i.e., electron density distribution, not obtained by X-ray tomography with lenses, atom probe microscopy, or electron tomography. We measured high-contrast coherent X-ray diffraction patterns of a shape-controlled Au/Ag nanoparticle and successfully reconstructed a projection and a three-dimensional image of the nanoparticle with a single pixel (or a voxel) size of 4.2 nm in each dimension. The small pits on the surface and a hollow interior were clearly visible. The Au-rich regions were identified based on the electron density distribution, which provided insight into the formation of Au/Ag nanoboxes.
Original language | English |
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Pages (from-to) | 1922-1926 |
Number of pages | 5 |
Journal | Nano Letters |
Volume | 10 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2010 May 12 |
Externally published | Yes |
Keywords
- Coherent X-ray diffraction microscopy
- Electron density
- Phase retrieval
- Shape-controlled nanoparticle
- X-ray free electron laser
ASJC Scopus subject areas
- Bioengineering
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics
- Mechanical Engineering