Three-dimensional electron density mapping of shape-controlled nanoparticle by focused hard X-ray diffraction microscopy

Yukio Takahashi, Nobuyuki Zettsu, Yoshinori Nishino, Ryosuke Tsutsumi, Eiichiro Matsubara, Tetsuya Ishikawa, Kazuto Yamauchi

Research output: Contribution to journalArticle

55 Citations (Scopus)

Abstract

Coherent diffraction microscopy using highly focused hard X-ray beams allows us to three-dimensionally observe thick objects with a high spatial resolution, also providing us with unique structural information, i.e., electron density distribution, not obtained by X-ray tomography with lenses, atom probe microscopy, or electron tomography. We measured high-contrast coherent X-ray diffraction patterns of a shape-controlled Au/Ag nanoparticle and successfully reconstructed a projection and a three-dimensional image of the nanoparticle with a single pixel (or a voxel) size of 4.2 nm in each dimension. The small pits on the surface and a hollow interior were clearly visible. The Au-rich regions were identified based on the electron density distribution, which provided insight into the formation of Au/Ag nanoboxes.

Original languageEnglish
Pages (from-to)1922-1926
Number of pages5
JournalNano Letters
Volume10
Issue number5
DOIs
Publication statusPublished - 2010 May 12
Externally publishedYes

Keywords

  • Coherent X-ray diffraction microscopy
  • Electron density
  • Phase retrieval
  • Shape-controlled nanoparticle
  • X-ray free electron laser

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

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