Abstract
Thin films of boron nitride were grown by femtosecond, pulsed laser deposition. The films were analyzed by transmission electron microscopy, Fourier transform infrared spectroscopy and Raman spectroscopy. All the results indicated the presence of wurtzite phase in the thin film in contrast to usual phases such as cubic or hexagonal ones. Moreover, the electron diffraction pattern showed that the size of the wurtzite boron nitride crystallite was larger than 4 μm although boron nitride films reported so far consisted of small crystallites in the nanometer region.
Original language | English |
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Title of host publication | ROMOPTO 2006 |
Subtitle of host publication | Eighth Conference on Optics |
Volume | 6785 |
DOIs | |
Publication status | Published - 2007 Nov 26 |
Externally published | Yes |
Event | ROMOPTO 2006: Eighth Conference on Optics - Sibiu Duration: 2006 Sep 4 → 2006 Sep 7 |
Other
Other | ROMOPTO 2006: Eighth Conference on Optics |
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City | Sibiu |
Period | 06/9/4 → 06/9/7 |
Keywords
- Boron nitride
- Femtosecond laser
- Pulsed laser deposition
- Thin film
- Wurtzite structure
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics