Thin film structure of yba2cu3o7-δ on (001) mgo substrate studied by tem

Hajime Suzuki, Hideyuki Kurosawa, Katsumi Miyagawa, Yoshihiko Hirotsu, Masanori Era, Tsutomu Yamashita, Toshio Hirai, Hisanori Yamane

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    9 Citations (Scopus)


    A plan-view TEM observation was made for YBa2Cu3O7-δ (YBCO) thin films prepared by MOCVD on (001) MgO substrates. For the TEM observation, the MgO substrate plates were ion-thinned before the YBCO deposition. The YBCO thin films were found to be polycrystalline with a grain size of about 0.5µm. Most of the YBCO grains are grown with their [001] axes nearly normal to the MgO substrate plane. Between the neighboring YBCO grains, a small-angle misorientation was observed quite frequently. Most of the misorientation angles measured by selected-area electron diffraction were less than about 5 degrees. At the small-angle grain boundaries, a nearly periodic array of dislocations was observed in the high-resolution lattice images. The AC and DC Josephson effects of YBCO thin film bridges reported previously are discussed in relation to the small-angle grain boundaries.

    Original languageEnglish
    Pages (from-to)L1648-L1651
    JournalJapanese journal of applied physics
    Issue number9
    Publication statusPublished - 1990 Sep


    • AC Josephson effect
    • DC Josephson effect
    • Grain-boundary junction
    • Lattice imaging
    • MOCVD, YBCO thin film
    • Small-angle grain boundary
    • TEM observation

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)


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