Thin-film growth of (110) rutile TiO2 on (100) Ge substrate by pulsed laser deposition

Yoshihisa Suzuki, Takahiro Nagata, Yoshiyuki Yamashita, Toshihide Nabatame, Atsushi Ogura, Toyohiro Chikyow

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

The deposition conditions of (100) rutile TiO2 grown on p-type (100) Ge substrates by pulsed laser deposition (PLD) were optimized to improve the electrical properties of the TiO2/Ge structure. Increasing the substrate temperature (Tsub) enhanced the grain growth, the surface roughness of the film, and Ge diffusion into the TiO2 layer. The growth rate, which was controlled by the laser density in PLD (Ld), affected the Ge diffusion. Ld of 0.35 J/cm2 (0.37 nm/min) enhanced the Ge diffusion and improved the crystallinity and surface roughness at a temperature of 450 °C, at which GeOx undergoes decomposition and desorption. However, the Ge diffusion into TiO2 degraded the electrical properties. By using the optimized conditions (Ld = 0.7 J/cm2 and Tsub = 420 °C) with postannealing, the TiO2/Ge structure showed an improvement in the leakage current of 3 orders of magnitude and the capacitance-voltage property characteristics indicated the formation of a p-n junction.

Original languageEnglish
Article number06GG06
JournalJapanese journal of applied physics
Volume55
Issue number6
DOIs
Publication statusPublished - 2016 Jun
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Thin-film growth of (110) rutile TiO<sub>2</sub> on (100) Ge substrate by pulsed laser deposition'. Together they form a unique fingerprint.

Cite this