Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling

V. A. Chernenko, M. Kohl, M. Ohtsuka, T. Takagi, V. A. L'vov, V. M. Kniazkyi

Research output: Contribution to journalArticlepeer-review

22 Citations (Scopus)

Abstract

A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.

Original languageEnglish
Pages (from-to)944-947
Number of pages4
JournalMaterials Science and Engineering A
Volume438-440
Issue numberSPEC. ISS.
DOIs
Publication statusPublished - 2006 Nov 25

Keywords

  • Alumina substrate
  • Martensitic transformation temperatures
  • Modeling
  • Ni-Mn-Ga thin films
  • Resistivity

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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