Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling

V. A. Chernenko; M. Kohl; M. Ohtsuka; T. Takagi; V. A. L'vov; V. M. Kniazkyi

doi:10.1016/j.msea.2006.02.055

Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling

V. A. Chernenko, M. Kohl, M. Ohtsuka, T. Takagi, V. A. L'vov, V. M. Kniazkyi

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.

Original language	English
Pages (from-to)	944-947
Number of pages	4
Journal	Materials Science and Engineering A
Volume	438-440
Issue number	SPEC. ISS.
DOIs	https://doi.org/10.1016/j.msea.2006.02.055
Publication status	Published - 2006 Nov 25

Keywords

Alumina substrate
Martensitic transformation temperatures
Modeling
Ni-Mn-Ga thin films
Resistivity

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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10.1016/j.msea.2006.02.055

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Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina : Experiment and modeling. / Chernenko, V. A.; Kohl, M.; Ohtsuka, M.; Takagi, T.; L'vov, V. A.; Kniazkyi, V. M.

In: Materials Science and Engineering A, Vol. 438-440, No. SPEC. ISS., 25.11.2006, p. 944-947.

Research output: Contribution to journal › Article › peer-review

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abstract = "A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.",

keywords = "Alumina substrate, Martensitic transformation temperatures, Modeling, Ni-Mn-Ga thin films, Resistivity",

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T2 - Experiment and modeling

AU - Chernenko, V. A.

AU - Kohl, M.

AU - Ohtsuka, M.

AU - Takagi, T.

AU - L'vov, V. A.

AU - Kniazkyi, V. M.

PY - 2006/11/25

Y1 - 2006/11/25

N2 - A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.

AB - A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.

KW - Alumina substrate

KW - Martensitic transformation temperatures

KW - Modeling

KW - Ni-Mn-Ga thin films

KW - Resistivity

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VL - 438-440

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EP - 947

JO - Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing

JF - Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing

SN - 0921-5093

IS - SPEC. ISS.

ER -

Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling

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Keywords

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