Abstract
A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.
Original language | English |
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Pages (from-to) | 944-947 |
Number of pages | 4 |
Journal | Materials Science and Engineering A |
Volume | 438-440 |
Issue number | SPEC. ISS. |
DOIs | |
Publication status | Published - 2006 Nov 25 |
Keywords
- Alumina substrate
- Martensitic transformation temperatures
- Modeling
- Ni-Mn-Ga thin films
- Resistivity
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering