Thickness dependence of photoemission spectra in zinc-blende CrAs

M. Mizuguchi, K. Ono, M. Oshima, J. Okabayashi, H. Akinaga, T. Manago, M. Shirai

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

The electronic structure of CrAs thin films with nominal thicknesses of 2 nm and 30 nm were studied by angle-resolved photoemission spectroscopy using synchrotron radiation. The CrAs film of 2 nm is expected to form a zinc-blende phase which is predicted to have a half-metallic band structure by theoretical calculation. On the other hand, it is considered that the CrAs film of 30 nm is a polycrystalline compound judging from reflection high-energy electron diffraction patterns. Different valence-band photoemission spectra were obtained for the two films. The photoemission spectra of the CrAs film of 30 nm showed no band dispersion, whereas a band dispersion was observed in that of the CrAs film with the nominal thickness of 2 nm.

Original languageEnglish
Pages (from-to)331-334
Number of pages4
JournalSurface Review and Letters
Volume9
Issue number1
DOIs
Publication statusPublished - 2002 Feb
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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