Abstract
The electronic structure of CrAs thin films with nominal thicknesses of 2 nm and 30 nm were studied by angle-resolved photoemission spectroscopy using synchrotron radiation. The CrAs film of 2 nm is expected to form a zinc-blende phase which is predicted to have a half-metallic band structure by theoretical calculation. On the other hand, it is considered that the CrAs film of 30 nm is a polycrystalline compound judging from reflection high-energy electron diffraction patterns. Different valence-band photoemission spectra were obtained for the two films. The photoemission spectra of the CrAs film of 30 nm showed no band dispersion, whereas a band dispersion was observed in that of the CrAs film with the nominal thickness of 2 nm.
Original language | English |
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Pages (from-to) | 331-334 |
Number of pages | 4 |
Journal | Surface Review and Letters |
Volume | 9 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2002 Feb 1 |
Externally published | Yes |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry