TY - JOUR
T1 - Thickness dependence of photoemission spectra in zinc-blende CrAs
AU - Mizuguchi, M.
AU - Ono, K.
AU - Oshima, M.
AU - Okabayashi, J.
AU - Akinaga, H.
AU - Manago, T.
AU - Shirai, M.
N1 - Funding Information:
This work, partly supported by the New Energy and Industrial Technology Development Organization (NEDO), was performed in the framework of the collaboration research between The University of Tokyo and JRCAT, and in the joint research agreement between AIST and the Angstrom Technology Partnership (ATP). This work was also partly supported by a Grant-in-Aid for Scienti c Research from the Ministry of Education, Science, and Culture in Japan. It was done under the project 97S1-002 at the Institute of Materials Structure Science in KEK.
PY - 2002/2
Y1 - 2002/2
N2 - The electronic structure of CrAs thin films with nominal thicknesses of 2 nm and 30 nm were studied by angle-resolved photoemission spectroscopy using synchrotron radiation. The CrAs film of 2 nm is expected to form a zinc-blende phase which is predicted to have a half-metallic band structure by theoretical calculation. On the other hand, it is considered that the CrAs film of 30 nm is a polycrystalline compound judging from reflection high-energy electron diffraction patterns. Different valence-band photoemission spectra were obtained for the two films. The photoemission spectra of the CrAs film of 30 nm showed no band dispersion, whereas a band dispersion was observed in that of the CrAs film with the nominal thickness of 2 nm.
AB - The electronic structure of CrAs thin films with nominal thicknesses of 2 nm and 30 nm were studied by angle-resolved photoemission spectroscopy using synchrotron radiation. The CrAs film of 2 nm is expected to form a zinc-blende phase which is predicted to have a half-metallic band structure by theoretical calculation. On the other hand, it is considered that the CrAs film of 30 nm is a polycrystalline compound judging from reflection high-energy electron diffraction patterns. Different valence-band photoemission spectra were obtained for the two films. The photoemission spectra of the CrAs film of 30 nm showed no band dispersion, whereas a band dispersion was observed in that of the CrAs film with the nominal thickness of 2 nm.
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U2 - 10.1142/S0218625X02002142
DO - 10.1142/S0218625X02002142
M3 - Article
AN - SCOPUS:0036462880
VL - 9
SP - 331
EP - 334
JO - Surface Review and Letters
JF - Surface Review and Letters
SN - 0218-625X
IS - 1
ER -