Thickness dependence of electronic structures in v O2 ultrathin films: Suppression of the cooperative Mott-Peierls transition

D. Shiga, B. E. Yang, N. Hasegawa, T. Kanda, R. Tokunaga, K. Yoshimatsu, R. Yukawa, M. Kitamura, K. Horiba, H. Kumigashira

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Thickness dependence of electronic structures in v O2 ultrathin films: Suppression of the cooperative Mott-Peierls transition'. Together they form a unique fingerprint.

Engineering

Chemistry

Material Science

Medicine and Dentistry

Neuroscience