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Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy
Yi Tao Cui, Sven Tougaard, Hiroshi Oji, Jin Young Son, Yasuhiro Sakamoto, Takuya Matsumoto, Anli Yang, Osami Sakata, Huaping Song, Ichiro Hirosawa
Research output: Contribution to journal › Article › peer-review
12
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(Scopus)