Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy

Yi Tao Cui, Sven Tougaard, Hiroshi Oji, Jin Young Son, Yasuhiro Sakamoto, Takuya Matsumoto, Anli Yang, Osami Sakata, Huaping Song, Ichiro Hirosawa

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12 Citations (Scopus)

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Physics & Astronomy