Thermoelectric properties and phase transition of (ZnxCu 2-x)V2O7

Kotaro Sotojima, Ryosuke O. Suzuki, Koji Amezawa, Yoichi Tomii

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Phase stability and thermoelectric properties of a layered structure of (ZnxCu2-x)V2O7 solid solution were studied at x > 0.2. X-ray diffraction measurements, compositional studies and thermal analysis clarified that the low temperature form of (Zn xCu2-x)V2O7 solid solution (monoclinic structure, C2/c) was stable at 0.2a≤x≤2 when annealed at 823 K in air. On heating, the phase transformation occurred at 0.2 ≤ x < 2 at a nearly constant temperature around 873 K, above which a high temperature form of (ZnxCu2-x)V2O7 solid solution was formed. Seebeck coefficients of the low temperature form of (Zn xCu2-x)V2O7 solid solution showed the large negative value of about -520 to -700μV/K, and the electrical resistivity increased with Zn addition. Power factor was the maximum of 1.99 × 10-7 W/m K2 at 873 K for the low temperature form of the (Zn0.2Cu1.8)V2O7 solid solution.

Original languageEnglish
Pages (from-to)356-361
Number of pages6
JournalFuntai Oyobi Fummatsu Yakin/Journal of the Japan Society of Powder and Powder Metallurgy
Volume54
Issue number5
DOIs
Publication statusPublished - 2007 May

Keywords

  • Electrical resistivity
  • Layered structure
  • Phase diagram
  • Seebeck coefficient
  • Vanadium oxide

ASJC Scopus subject areas

  • Mechanical Engineering
  • Industrial and Manufacturing Engineering
  • Metals and Alloys
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Thermoelectric properties and phase transition of (Zn<sub>x</sub>Cu <sub>2-x</sub>)V<sub>2</sub>O<sub>7</sub>'. Together they form a unique fingerprint.

Cite this