TY - JOUR
T1 - Thermoelectric performance of Al-Pd-Mn quasicrystals
T2 - Comparison with (1/1,2/1-)AlPdMnSi approximants and improvement by Ga substitution for Al
AU - Takagiwa, Yoshiki
AU - Kamimura, Takahiko
AU - Hosoi, Sizuka
AU - Okada, Junpei Tamura
AU - Kimura, Kaoru
N1 - Funding Information:
Acknowledgments. EPMA measurement was performed using facilities of the Materials Design and Characterization Laboratory, Institute for Solid State Physics, the University of Tokyo. This work supported from Research Fellowships of the Japan Society for the Promotion of Science (JSPS), and is partly supported by a Grant-in-Aid for Scientific Research from JSPS and the Ministry of Education, Culture, Sports, Science and Technology of Japan (MEXT).
PY - 2009
Y1 - 2009
N2 - We report the thermoelectric properties of polygrain icosahedral Al-Pd-Mn quasicrystal and compare with those of (1/1, 2/1-)AlPdMnSi approximant crystals. To improve the dimensionless figure of merit (ZT), we substitute Ga for Al atoms in Al-Pd-Mn quasicrystal in accordance with the guiding principle of "weakly bonded rigid heavy clusters" (WBRHCs). Although the thermoelectric properties do not obey the WBRHCs principle, the maximum ZT increased by a factor of 1.4 from 0.18 for Al71Pd20Mn 9 to 0.26 for Al68Ga3Pd20Mn 9 quasicrystal.
AB - We report the thermoelectric properties of polygrain icosahedral Al-Pd-Mn quasicrystal and compare with those of (1/1, 2/1-)AlPdMnSi approximant crystals. To improve the dimensionless figure of merit (ZT), we substitute Ga for Al atoms in Al-Pd-Mn quasicrystal in accordance with the guiding principle of "weakly bonded rigid heavy clusters" (WBRHCs). Although the thermoelectric properties do not obey the WBRHCs principle, the maximum ZT increased by a factor of 1.4 from 0.18 for Al71Pd20Mn 9 to 0.26 for Al68Ga3Pd20Mn 9 quasicrystal.
KW - Al-Pd-Mn - (Si)
KW - Approximant crystals
KW - Quasicrystals
KW - Thermoelectric properties
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U2 - 10.1524/zkri.2009.1061
DO - 10.1524/zkri.2009.1061
M3 - Article
AN - SCOPUS:64149108093
SN - 0044-2968
VL - 224
SP - 21
EP - 25
JO - Zeitschfrift fur Kristallographie
JF - Zeitschfrift fur Kristallographie
IS - 1-2
ER -