@article{a9503a86248242a7836d146f9712c642,
title = "Thermally induced structural characteristics of pentacene thin films",
abstract = "The influence of postdeposition thermal treatment on the structural characteristics of vacuum deposited pentacene thin films was systematically investigated. With increasing annealing temperature, the film crystallinity decreased regularly and significantly, while structural analysis by using the paracrystal theory revealed an increased vertical coherent diffraction domain size. Influence of the structural evolution on the thin film transistor performance was demonstrated by a variable temperature structural and electrical characterization. The results indicate that a thermally induced structural evolution should be generally taken into account for understanding the charge transport nature of the materials.",
author = "Dong Guo and Susumu Ikeda and Koichiro Saiki",
note = "Funding Information: This research is supported by a Grant-in-Aid for Scientific research from MEXT of Japan (Grant No. 14GS0207). One of the authors (Dong Guo) is also grateful to the Japan Society for the Promotion of Science (JSPS) for its financial support. FIG. 1. AFM images showing the morphology of 40 nm pentacene films annealed at a temperature of (a) RT, (b) 45, (c) 50, (d) 60, and (e) 70 ° C . The height profile along the black arrow in (e) is shown in (f). FIG. 2. XRD profiles of differently annealed 40 nm pentacene film samples. The inset shows the T a dependence of the (001) peak intensity. FIG. 3. Integral width of the XRD peaks vs square of the diffraction order of different samples. The derived coherent diffraction domain sizes ( l ) are also listed. FIG. 4. Arrhenius plots of the mobility μ (at V g = − 50 V ) of three TFT samples heated to different temperatures. The arrows indicate the maximum mobility position. FIG. 5. Arrhenius plots of linear mobility μ L at different V g for the TFT sample heated to 85 ° C . The activation energy E a of each curve is also listed. The arrow indicates the maximum mobility position. FIG. 6. Transfer curves at V d = − 50 V of the same sample (a) before and (b) after 85 ° C characterization (the TC sample ). The AFM images in the inset compare the corresponding morphology. ",
year = "2009",
doi = "10.1063/1.3132824",
language = "English",
volume = "105",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "11",
}