Thermally induced structural characteristics of pentacene thin films

Dong Guo, Susumu Ikeda, Koichiro Saiki

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

The influence of postdeposition thermal treatment on the structural characteristics of vacuum deposited pentacene thin films was systematically investigated. With increasing annealing temperature, the film crystallinity decreased regularly and significantly, while structural analysis by using the paracrystal theory revealed an increased vertical coherent diffraction domain size. Influence of the structural evolution on the thin film transistor performance was demonstrated by a variable temperature structural and electrical characterization. The results indicate that a thermally induced structural evolution should be generally taken into account for understanding the charge transport nature of the materials.

Original languageEnglish
Article number113520
JournalJournal of Applied Physics
Volume105
Issue number11
DOIs
Publication statusPublished - 2009 Jul 6
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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