Thermal management design for GMR head ESD-robustness

Y. Ohsawa, T. Funayama, H. Sakata, H. Yoda, M. Sahashi

Research output: Contribution to journalConference articlepeer-review


In this study, the effects of heat generation, heat conduction through spin-valve (SV), and blocking temperature (Tb) on ESD failure voltage are estimated by a test element experiment. The results emphasize the importance of decrease in SV/lead contact resistance.

Original languageEnglish
Pages (from-to)DB-08
JournalDigests of the Intermag Conference
Publication statusPublished - 1999
EventProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
Duration: 1999 May 181999 May 21

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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