Thermal conductivities of yttria-stabilized zirconia films measured by a laser-heating AC method

Teiichi Kimura, Takashi Goto

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

Yttria-stabilized zirconia (YSZ) films were prepared by a rf magnetron sputtering and a laser chemical vapor deposition (LCVD), and their thermal conductivities were measured using a laser-heating AC method. Sputtered-YSZ films had a dense isotropic microstructure, and the thermal conductivity was almost the same as that of a bulk YSZ. LCVD-YSZ films had an anisotropic columnar microstructure, and the thermal conductivity was 1/3-/4 as that of a bulk YSZ. Such a low-thermal conductivity of LCVD-YSZ films would be caused by nano-gaps between columns and many nano-pores in the columns.

Original languageEnglish
Pages (from-to)129-132
Number of pages4
JournalSurface and Coatings Technology
Volume198
Issue number1-3 SPEC. ISS.
DOIs
Publication statusPublished - 2005 Aug 1

Keywords

  • AC calorimetry
  • Laser CVD
  • Nano-structure
  • Thermal barrier coating
  • Thermal conductivity
  • Yttria-stabilized zirconia

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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