Abstract
Yttria-stabilized zirconia (YSZ) films were prepared by a rf magnetron sputtering and a laser chemical vapor deposition (LCVD), and their thermal conductivities were measured using a laser-heating AC method. Sputtered-YSZ films had a dense isotropic microstructure, and the thermal conductivity was almost the same as that of a bulk YSZ. LCVD-YSZ films had an anisotropic columnar microstructure, and the thermal conductivity was 1/3-/4 as that of a bulk YSZ. Such a low-thermal conductivity of LCVD-YSZ films would be caused by nano-gaps between columns and many nano-pores in the columns.
Original language | English |
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Pages (from-to) | 129-132 |
Number of pages | 4 |
Journal | Surface and Coatings Technology |
Volume | 198 |
Issue number | 1-3 SPEC. ISS. |
DOIs | |
Publication status | Published - 2005 Aug 1 |
Keywords
- AC calorimetry
- Laser CVD
- Nano-structure
- Thermal barrier coating
- Thermal conductivity
- Yttria-stabilized zirconia
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry