Thermal conductivities of yttria-stabilized zirconia films measured by a laser-heating AC method

Teiichi Kimura; Takashi Goto

doi:10.1016/j.surfcoat.2004.10.027

Thermal conductivities of yttria-stabilized zirconia films measured by a laser-heating AC method

Teiichi Kimura, Takashi Goto

Materials Processing and Characterization Division

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

Yttria-stabilized zirconia (YSZ) films were prepared by a rf magnetron sputtering and a laser chemical vapor deposition (LCVD), and their thermal conductivities were measured using a laser-heating AC method. Sputtered-YSZ films had a dense isotropic microstructure, and the thermal conductivity was almost the same as that of a bulk YSZ. LCVD-YSZ films had an anisotropic columnar microstructure, and the thermal conductivity was 1/3-/4 as that of a bulk YSZ. Such a low-thermal conductivity of LCVD-YSZ films would be caused by nano-gaps between columns and many nano-pores in the columns.

Original language	English
Pages (from-to)	129-132
Number of pages	4
Journal	Surface and Coatings Technology
Volume	198
Issue number	1-3 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.surfcoat.2004.10.027
Publication status	Published - 2005 Aug 1

Keywords

AC calorimetry
Laser CVD
Nano-structure
Thermal barrier coating
Thermal conductivity
Yttria-stabilized zirconia

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

Access to Document

10.1016/j.surfcoat.2004.10.027

Cite this

@article{076ebe71b9f142e187b58292f1303155,

title = "Thermal conductivities of yttria-stabilized zirconia films measured by a laser-heating AC method",

abstract = "Yttria-stabilized zirconia (YSZ) films were prepared by a rf magnetron sputtering and a laser chemical vapor deposition (LCVD), and their thermal conductivities were measured using a laser-heating AC method. Sputtered-YSZ films had a dense isotropic microstructure, and the thermal conductivity was almost the same as that of a bulk YSZ. LCVD-YSZ films had an anisotropic columnar microstructure, and the thermal conductivity was 1/3-/4 as that of a bulk YSZ. Such a low-thermal conductivity of LCVD-YSZ films would be caused by nano-gaps between columns and many nano-pores in the columns.",

keywords = "AC calorimetry, Laser CVD, Nano-structure, Thermal barrier coating, Thermal conductivity, Yttria-stabilized zirconia",

author = "Teiichi Kimura and Takashi Goto",

year = "2005",

month = aug,

day = "1",

doi = "10.1016/j.surfcoat.2004.10.027",

language = "English",

volume = "198",

pages = "129--132",

journal = "Surface and Coatings Technology",

issn = "0257-8972",

publisher = "Elsevier",

number = "1-3 SPEC. ISS.",

}

TY - JOUR

T1 - Thermal conductivities of yttria-stabilized zirconia films measured by a laser-heating AC method

AU - Kimura, Teiichi

AU - Goto, Takashi

PY - 2005/8/1

Y1 - 2005/8/1

N2 - Yttria-stabilized zirconia (YSZ) films were prepared by a rf magnetron sputtering and a laser chemical vapor deposition (LCVD), and their thermal conductivities were measured using a laser-heating AC method. Sputtered-YSZ films had a dense isotropic microstructure, and the thermal conductivity was almost the same as that of a bulk YSZ. LCVD-YSZ films had an anisotropic columnar microstructure, and the thermal conductivity was 1/3-/4 as that of a bulk YSZ. Such a low-thermal conductivity of LCVD-YSZ films would be caused by nano-gaps between columns and many nano-pores in the columns.

AB - Yttria-stabilized zirconia (YSZ) films were prepared by a rf magnetron sputtering and a laser chemical vapor deposition (LCVD), and their thermal conductivities were measured using a laser-heating AC method. Sputtered-YSZ films had a dense isotropic microstructure, and the thermal conductivity was almost the same as that of a bulk YSZ. LCVD-YSZ films had an anisotropic columnar microstructure, and the thermal conductivity was 1/3-/4 as that of a bulk YSZ. Such a low-thermal conductivity of LCVD-YSZ films would be caused by nano-gaps between columns and many nano-pores in the columns.

KW - AC calorimetry

KW - Laser CVD

KW - Nano-structure

KW - Thermal barrier coating

KW - Thermal conductivity

KW - Yttria-stabilized zirconia

UR - http://www.scopus.com/inward/record.url?scp=20744444270&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=20744444270&partnerID=8YFLogxK

U2 - 10.1016/j.surfcoat.2004.10.027

DO - 10.1016/j.surfcoat.2004.10.027

M3 - Article

AN - SCOPUS:20744444270

VL - 198

SP - 129

EP - 132

JO - Surface and Coatings Technology

JF - Surface and Coatings Technology

SN - 0257-8972

IS - 1-3 SPEC. ISS.

ER -

Thermal conductivities of yttria-stabilized zirconia films measured by a laser-heating AC method

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this