Theory of interface resistances

K. M. Schep, J. B.A.N. Van Hoof, P. J. Kelly, G. E.W. Bauer, J. E. Inglesfield

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The interface resistances of magnetic multilayers are calculated without any adjustable parameters by combining first-principles electronic structure calculations with the Boltzmann equation. The microscopic mechanism of specular interface scattering in combination with diffuse bulk scattering can largely explain the experimentally observed values for the interface resistances of Co/Cu multilayers.

Original languageEnglish
Pages (from-to)1166-1167
Number of pages2
JournalJournal of Magnetism and Magnetic Materials
Volume177-181
Issue numberPART 2
DOIs
Publication statusPublished - 1998 Jan
Externally publishedYes

Keywords

  • Electrical transport
  • Electronic structure
  • Interface resistance
  • Magnetoresistance - giant
  • Magnetoresistance - theory

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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  • Cite this

    Schep, K. M., Van Hoof, J. B. A. N., Kelly, P. J., Bauer, G. E. W., & Inglesfield, J. E. (1998). Theory of interface resistances. Journal of Magnetism and Magnetic Materials, 177-181(PART 2), 1166-1167. https://doi.org/10.1016/S0304-8853(97)00749-X