Theory for the atomic force microscopy of deformable surfaces

D. Tomnek, G. Overney, Hiroshi Miyazaki, S. D. Mahanti, H. J. Gntherodt

Research output: Contribution to journalArticlepeer-review

63 Citations (Scopus)

Abstract

We present a theory for the atomic force microscopy (AFM) of deformable surfaces and apply it to graphite with and without intercalated atoms. Using continuum elasticity theory for graphite layers, with parameters obtained from ab initio calculations, we determine quantitatively local distortions in the vicinity of a sharp AFM tip as a function of the applied force. Our calculations show that AFM should be a unique tool to determine local surface rigidity and to measure the healing length of graphite in the vicinity of intercalated impurities or steps.

Original languageEnglish
Pages (from-to)876-879
Number of pages4
JournalPhysical Review Letters
Volume63
Issue number8
DOIs
Publication statusPublished - 1989 Jan 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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