Theoretical aspect of X-ray phase microscopy with transmission gratings

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

One of the advantages of X-ray grating interferometry is that it can work with spherical-wave illumination of X-rays. This means that the interferometry can be combined with an X-ray imaging microscopy to achieve a high spatial resolution. We have developed three types of X-ray phase imaging microscopies, which are based on a self-imaging phenomenon called the Talbot effect. The first type is an X-ray imaging microscopy just combined with X-ray Talbot interferometry, where two transmission gratings are used. The other two are novel X-ray phase imaging microscopies, where the self-image of a transmission grating is highly magnified and resolved by an image detector: one has been achieved by a single X-ray source and the other is what we call Lau-type X-ray phase imaging microscopy, where an array of mutually incoherent X-ray sources has been used. These two microscopies have overcome several problems of the Talbot-interferometer-type X-ray imaging microscopy, i.e., they provide a phase difference image (twin phase images separated by a specific distance) and hence have high sensitivities and high spatial resolutions. Quantitative phase imaging even for non-weak-phase objects has also been performed that are difficult to be achieved by the widely used Zernike phase-contrast microscopy. In this paper, we outline a theoretical description of the three types of the X-ray imaging microscopes using transmission gratings as well as the corresponding three types of X-ray projection microscopes.

Original languageEnglish
Title of host publicationInternational Workshop on X-Ray and Neutron Phase Imaging with Gratings
Pages144-149
Number of pages6
DOIs
Publication statusPublished - 2012
Externally publishedYes
EventInternational Workshop on X-Ray and Neutron Phase Imaging with Gratings, XNPIG 2012 - Tokyo, Japan
Duration: 2012 Mar 52012 Mar 7

Publication series

NameAIP Conference Proceedings
Volume1466
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherInternational Workshop on X-Ray and Neutron Phase Imaging with Gratings, XNPIG 2012
CountryJapan
CityTokyo
Period12/3/512/3/7

Keywords

  • Talbot effect
  • X-ray microscopy
  • X-ray phase imaging
  • interferometer

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Theoretical aspect of X-ray phase microscopy with transmission gratings'. Together they form a unique fingerprint.

Cite this