We describe theoretical and experimental studies for nano-scale ferroelectric domain measurements using scanning nonlinear dielectric microscopy (SNDM). We calculate one-dimensional images of a 180° c-c domain boundary and show that SNDM has an atomic-scale resolution theoretically. Experimental results show that we measure the c-c domain on the lead zirconate titanate (PZT) thin film with the width of 1.5 nm and that the resolution of the microscope is less than 0.5 nm.
|Number of pages||4|
|Journal||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|Issue number||9 B|
|Publication status||Published - 2000 Sep|
ASJC Scopus subject areas
- Physics and Astronomy(all)