The study of multiwall carbon nanotubes light reflectivity

Yun Hsih Chou; Chuan Ping Juan; Liang Yu Yen; Chun Liang Yang; Yang Han Lee; Yih Guang Jan; Qiang Chen

doi:10.1109/INEC.2011.5991656

The study of multiwall carbon nanotubes light reflectivity

Yun Hsih Chou, Chuan Ping Juan, Liang Yu Yen, Chun Liang Yang, Yang Han Lee, Yih Guang Jan, Qiang Chen

ENG - Communications Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

In this paper we study the light reflectivity of multiwall carbon nanotubes (MWCNTs) in the wavelength of range 1150nm-1755 nm, it reveals from our measurements that when the multiwall carbon nanotubes are pattern-grown its return loss is linear inversely proportional to the nanotubes grown height and with this characteristics the pattern-grown CNTs can be utilized as a good optical attenuator. However for nanotubes when it is fabricated in high density but pattern-less it has greater than 45 dB return loss, this is equivalent to have less than 0.56% reflectivity; it has high absorption effect and consequently can be utilized as a black body absorber.

Original language	English
Title of host publication	4th IEEE International NanoElectronics Conference, INEC 2011
DOIs	https://doi.org/10.1109/INEC.2011.5991656
Publication status	Published - 2011 Sep 26
Event	4th IEEE International Nanoelectronics Conference, INEC 2011 - Tao-Yuan, Taiwan, Province of China Duration: 2011 Jun 21 → 2011 Jun 24

Publication series

Name	Proceedings - International NanoElectronics Conference, INEC
ISSN (Print)	2159-3523

Other

Other	4th IEEE International Nanoelectronics Conference, INEC 2011
Country/Territory	Taiwan, Province of China
City	Tao-Yuan
Period	11/6/21 → 11/6/24

Keywords

Black Body Absorber
CNT
Introduction

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/INEC.2011.5991656

Cite this

Chou, YH, Juan, CP, Yen, LY, Yang, CL, Lee, YH, Jan, YG & Chen, Q 2011, The study of multiwall carbon nanotubes light reflectivity. in 4th IEEE International NanoElectronics Conference, INEC 2011., 5991656, Proceedings - International NanoElectronics Conference, INEC, 4th IEEE International Nanoelectronics Conference, INEC 2011, Tao-Yuan, Taiwan, Province of China, 11/6/21. https://doi.org/10.1109/INEC.2011.5991656

@inproceedings{8656f82a8e134400a82a3d2030ad22a3,

title = "The study of multiwall carbon nanotubes light reflectivity",

abstract = "In this paper we study the light reflectivity of multiwall carbon nanotubes (MWCNTs) in the wavelength of range 1150nm-1755 nm, it reveals from our measurements that when the multiwall carbon nanotubes are pattern-grown its return loss is linear inversely proportional to the nanotubes grown height and with this characteristics the pattern-grown CNTs can be utilized as a good optical attenuator. However for nanotubes when it is fabricated in high density but pattern-less it has greater than 45 dB return loss, this is equivalent to have less than 0.56% reflectivity; it has high absorption effect and consequently can be utilized as a black body absorber.",

keywords = "Black Body Absorber, CNT, Introduction",

author = "Chou, {Yun Hsih} and Juan, {Chuan Ping} and Yen, {Liang Yu} and Yang, {Chun Liang} and Lee, {Yang Han} and Jan, {Yih Guang} and Qiang Chen",

year = "2011",

month = sep,

day = "26",

doi = "10.1109/INEC.2011.5991656",

language = "English",

isbn = "9781457703799",

series = "Proceedings - International NanoElectronics Conference, INEC",

booktitle = "4th IEEE International NanoElectronics Conference, INEC 2011",

note = "4th IEEE International Nanoelectronics Conference, INEC 2011 ; Conference date: 21-06-2011 Through 24-06-2011",

}

TY - GEN

T1 - The study of multiwall carbon nanotubes light reflectivity

AU - Chou, Yun Hsih

AU - Juan, Chuan Ping

AU - Yen, Liang Yu

AU - Yang, Chun Liang

AU - Lee, Yang Han

AU - Jan, Yih Guang

AU - Chen, Qiang

PY - 2011/9/26

Y1 - 2011/9/26

N2 - In this paper we study the light reflectivity of multiwall carbon nanotubes (MWCNTs) in the wavelength of range 1150nm-1755 nm, it reveals from our measurements that when the multiwall carbon nanotubes are pattern-grown its return loss is linear inversely proportional to the nanotubes grown height and with this characteristics the pattern-grown CNTs can be utilized as a good optical attenuator. However for nanotubes when it is fabricated in high density but pattern-less it has greater than 45 dB return loss, this is equivalent to have less than 0.56% reflectivity; it has high absorption effect and consequently can be utilized as a black body absorber.

AB - In this paper we study the light reflectivity of multiwall carbon nanotubes (MWCNTs) in the wavelength of range 1150nm-1755 nm, it reveals from our measurements that when the multiwall carbon nanotubes are pattern-grown its return loss is linear inversely proportional to the nanotubes grown height and with this characteristics the pattern-grown CNTs can be utilized as a good optical attenuator. However for nanotubes when it is fabricated in high density but pattern-less it has greater than 45 dB return loss, this is equivalent to have less than 0.56% reflectivity; it has high absorption effect and consequently can be utilized as a black body absorber.

KW - Black Body Absorber

KW - CNT

KW - Introduction

UR - http://www.scopus.com/inward/record.url?scp=80052986718&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80052986718&partnerID=8YFLogxK

U2 - 10.1109/INEC.2011.5991656

DO - 10.1109/INEC.2011.5991656

M3 - Conference contribution

AN - SCOPUS:80052986718

SN - 9781457703799

T3 - Proceedings - International NanoElectronics Conference, INEC

BT - 4th IEEE International NanoElectronics Conference, INEC 2011

T2 - 4th IEEE International Nanoelectronics Conference, INEC 2011

Y2 - 21 June 2011 through 24 June 2011

ER -

The study of multiwall carbon nanotubes light reflectivity

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this