The resonant III-nitride grating reflector

Yongjin Wang, Tong Wu, Takuma Tanae, Hongbo Zhu, Kazuhiro Hane

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

We report here on the fabrication of a guided-mode resonant III-nitride grating reflector on a silicon substrate. In addition to compensating the residual stress of III-nitride layers, hafnium oxide (HfO2) film also serves as a hard mask during inductively coupled plasma reactive ion etching of III-nitride layers. The silicon substrate underneath the III-nitride gratings is etched and thus the III-nitride gratings are released and freely suspended with air as low refractive index materials on the top and bottom. The guided-mode resonances that are affected by the grating period, duty ratio, polarization and effective refractive index are experimentally characterized in the reflectance measurements. These works open the possibility of fabricating resonant III-nitride structures on the silicon substrate for further tunable III-nitride optical devices and integrated optics.

Original languageEnglish
Article number105025
JournalJournal of Micromechanics and Microengineering
Volume21
Issue number10
DOIs
Publication statusPublished - 2011 Oct

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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