The oxygen permeation properties of nanocrystalline Ce O2 thin films

K. S. Brinkman, H. Takamura, H. L. Tuller, T. Iijima

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14 Citations (Scopus)

Abstract

The measurement of oxygen flux across nanocrystalline cerium oxide (Ce O2) thin films at intermediate temperature (650-800°C) is presented. Porous ceria support substrates were fabricated by sintering with carbon additions. The final dense film was deposited from an optimized sol-gel solution resulting in a mean grain size of 50 nm, which displayed oxygen flux values of up to 0.014 μ mol/ cm2 s over the oxygen partial pressure range from air to helium gas used in the measurement at 800°C. The oxygen flux characteristics confirm mixed ionic and electronic conductivities in nanocrystalline ceria films and demonstrate the role of size dependent materials properties as a design parameter in functional membranes for oxygen separation.

Original languageEnglish
Pages (from-to)B1852-B1857
JournalJournal of the Electrochemical Society
Volume157
Issue number12
DOIs
Publication statusPublished - 2010

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Renewable Energy, Sustainability and the Environment
  • Surfaces, Coatings and Films
  • Electrochemistry
  • Materials Chemistry

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