The measurement of oxygen flux across nanocrystalline cerium oxide (Ce O2) thin films at intermediate temperature (650-800°C) is presented. Porous ceria support substrates were fabricated by sintering with carbon additions. The final dense film was deposited from an optimized sol-gel solution resulting in a mean grain size of 50 nm, which displayed oxygen flux values of up to 0.014 μ mol/ cm2 s over the oxygen partial pressure range from air to helium gas used in the measurement at 800°C. The oxygen flux characteristics confirm mixed ionic and electronic conductivities in nanocrystalline ceria films and demonstrate the role of size dependent materials properties as a design parameter in functional membranes for oxygen separation.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Renewable Energy, Sustainability and the Environment
- Surfaces, Coatings and Films
- Materials Chemistry