The overlayer structure on the Si(001)-(2×3)-Ag surface determined by X-ray photoelectron diffraction

M. Shimomura, T. Abukawa, M. Higa, M. Nakamura, S. M. Shivaprasad, H. W. Yeom, S. Suzuki, S. Sato, J. Tani, S. Kono

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Fingerprint

Dive into the research topics of 'The overlayer structure on the Si(001)-(2×3)-Ag surface determined by X-ray photoelectron diffraction'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy