The overlayer structure on the Si(001)-(2×3)-Ag surface determined by X-ray photoelectron diffraction

M. Shimomura, T. Abukawa, M. Higa, M. Nakamura, S. M. Shivaprasad, H. W. Yeom, S. Suzuki, S. Sato, J. Tani, S. Kono

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