The origin of field-induced electron emission from N-doped CVD diamond characterized by combined XPS/UPS/FES system

Hisato Yamaguchi; Yuki Kudo; Tomoaki Masuzawa; Yoshifumi Shiraki; Ichitaro Saito; Masato Kudo; Takatoshi Yamada; Yuji Takakuwa; Ken Okano

The origin of field-induced electron emission from N-doped CVD diamond characterized by combined XPS/UPS/FES system

Hisato Yamaguchi, Yuki Kudo, Tomoaki Masuzawa, Yoshifumi Shiraki, Ichitaro Saito, Masato Kudo, Takatoshi Yamada, Yuji Takakuwa, Ken Okano

Division of Measurements

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The origin of field-emitted electrons for hydrogen-terminated natural IIb diamond was investigated as a reference to define the origin of field-emitted electrons from lightly nitrogen (N)-doped chemical vapor deposition (CVD) diamond. Using our combined X-ray photoelectron spectroscopy / ultraviolet photoelectron spectroscopy / field emission spectroscopy (XPS/UPS/FES) system, we determined the origin of field-emitted electrons for the natural diamond. The energy level of field-emitted electrons was at valence band maximum (VBM) and the origin of field-emitted electrons was independent of applied voltages. The results suggested the observed shift for FES peak of lightly N-doped CVD diamond is most likely due to the resistance of the diamond bulk. The FES Peak Energy - Emission Current characteristics was best fitted to straight lines, and the resistance of the diamond was consistent with the resistance obtained from the slope. In addition, an attempt was made to define the origin of field-induced electron emission for heavily N-doped CVD diamond. The result suggested a possibility of conduction band minimum (CBM) as an origin of emitted electrons.

Original language	English
Title of host publication	Materials Research Society Symposium Proceedings
Subtitle of host publication	Diamond Electronics - Fundamentals to Applications II
Pages	135-141
Number of pages	7
Publication status	Published - 2008 Nov 13
Event	Diamond Electronics - Fundamentals to Applications II - Boston, MA, United States Duration: 2007 Nov 26 → 2007 Nov 30

Publication series

Name	Materials Research Society Symposium Proceedings
Volume	1039
ISSN (Print)	0272-9172

Other

Other	Diamond Electronics - Fundamentals to Applications II
Country	United States
City	Boston, MA
Period	07/11/26 → 07/11/30

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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Yamaguchi, H., Kudo, Y., Masuzawa, T., Shiraki, Y., Saito, I., Kudo, M., Yamada, T., Takakuwa, Y., & Okano, K. (2008). The origin of field-induced electron emission from N-doped CVD diamond characterized by combined XPS/UPS/FES system. In Materials Research Society Symposium Proceedings: Diamond Electronics - Fundamentals to Applications II (pp. 135-141). (Materials Research Society Symposium Proceedings; Vol. 1039).

The origin of field-induced electron emission from N-doped CVD diamond characterized by combined XPS/UPS/FES system. / Yamaguchi, Hisato; Kudo, Yuki; Masuzawa, Tomoaki; Shiraki, Yoshifumi; Saito, Ichitaro; Kudo, Masato; Yamada, Takatoshi; Takakuwa, Yuji; Okano, Ken.

Materials Research Society Symposium Proceedings: Diamond Electronics - Fundamentals to Applications II. 2008. p. 135-141 (Materials Research Society Symposium Proceedings; Vol. 1039).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yamaguchi, H, Kudo, Y, Masuzawa, T, Shiraki, Y, Saito, I, Kudo, M, Yamada, T, Takakuwa, Y & Okano, K 2008, The origin of field-induced electron emission from N-doped CVD diamond characterized by combined XPS/UPS/FES system. in Materials Research Society Symposium Proceedings: Diamond Electronics - Fundamentals to Applications II. Materials Research Society Symposium Proceedings, vol. 1039, pp. 135-141, Diamond Electronics - Fundamentals to Applications II, Boston, MA, United States, 07/11/26.

Yamaguchi, Hisato ; Kudo, Yuki ; Masuzawa, Tomoaki ; Shiraki, Yoshifumi ; Saito, Ichitaro ; Kudo, Masato ; Yamada, Takatoshi ; Takakuwa, Yuji ; Okano, Ken. / The origin of field-induced electron emission from N-doped CVD diamond characterized by combined XPS/UPS/FES system. Materials Research Society Symposium Proceedings: Diamond Electronics - Fundamentals to Applications II. 2008. pp. 135-141 (Materials Research Society Symposium Proceedings).

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title = "The origin of field-induced electron emission from N-doped CVD diamond characterized by combined XPS/UPS/FES system",

abstract = "The origin of field-emitted electrons for hydrogen-terminated natural IIb diamond was investigated as a reference to define the origin of field-emitted electrons from lightly nitrogen (N)-doped chemical vapor deposition (CVD) diamond. Using our combined X-ray photoelectron spectroscopy / ultraviolet photoelectron spectroscopy / field emission spectroscopy (XPS/UPS/FES) system, we determined the origin of field-emitted electrons for the natural diamond. The energy level of field-emitted electrons was at valence band maximum (VBM) and the origin of field-emitted electrons was independent of applied voltages. The results suggested the observed shift for FES peak of lightly N-doped CVD diamond is most likely due to the resistance of the diamond bulk. The FES Peak Energy - Emission Current characteristics was best fitted to straight lines, and the resistance of the diamond was consistent with the resistance obtained from the slope. In addition, an attempt was made to define the origin of field-induced electron emission for heavily N-doped CVD diamond. The result suggested a possibility of conduction band minimum (CBM) as an origin of emitted electrons.",

author = "Hisato Yamaguchi and Yuki Kudo and Tomoaki Masuzawa and Yoshifumi Shiraki and Ichitaro Saito and Masato Kudo and Takatoshi Yamada and Yuji Takakuwa and Ken Okano",

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AU - Yamaguchi, Hisato

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AU - Shiraki, Yoshifumi

AU - Saito, Ichitaro

AU - Kudo, Masato

AU - Yamada, Takatoshi

AU - Takakuwa, Yuji

AU - Okano, Ken

PY - 2008/11/13

Y1 - 2008/11/13

N2 - The origin of field-emitted electrons for hydrogen-terminated natural IIb diamond was investigated as a reference to define the origin of field-emitted electrons from lightly nitrogen (N)-doped chemical vapor deposition (CVD) diamond. Using our combined X-ray photoelectron spectroscopy / ultraviolet photoelectron spectroscopy / field emission spectroscopy (XPS/UPS/FES) system, we determined the origin of field-emitted electrons for the natural diamond. The energy level of field-emitted electrons was at valence band maximum (VBM) and the origin of field-emitted electrons was independent of applied voltages. The results suggested the observed shift for FES peak of lightly N-doped CVD diamond is most likely due to the resistance of the diamond bulk. The FES Peak Energy - Emission Current characteristics was best fitted to straight lines, and the resistance of the diamond was consistent with the resistance obtained from the slope. In addition, an attempt was made to define the origin of field-induced electron emission for heavily N-doped CVD diamond. The result suggested a possibility of conduction band minimum (CBM) as an origin of emitted electrons.

AB - The origin of field-emitted electrons for hydrogen-terminated natural IIb diamond was investigated as a reference to define the origin of field-emitted electrons from lightly nitrogen (N)-doped chemical vapor deposition (CVD) diamond. Using our combined X-ray photoelectron spectroscopy / ultraviolet photoelectron spectroscopy / field emission spectroscopy (XPS/UPS/FES) system, we determined the origin of field-emitted electrons for the natural diamond. The energy level of field-emitted electrons was at valence band maximum (VBM) and the origin of field-emitted electrons was independent of applied voltages. The results suggested the observed shift for FES peak of lightly N-doped CVD diamond is most likely due to the resistance of the diamond bulk. The FES Peak Energy - Emission Current characteristics was best fitted to straight lines, and the resistance of the diamond was consistent with the resistance obtained from the slope. In addition, an attempt was made to define the origin of field-induced electron emission for heavily N-doped CVD diamond. The result suggested a possibility of conduction band minimum (CBM) as an origin of emitted electrons.

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