The origin of field-induced electron emission from N-doped CVD diamond characterized by combined XPS/UPS/FES system

Hisato Yamaguchi, Yuki Kudo, Tomoaki Masuzawa, Yoshifumi Shiraki, Ichitaro Saito, Masato Kudo, Takatoshi Yamada, Yuji Takakuwa, Ken Okano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The origin of field-emitted electrons for hydrogen-terminated natural IIb diamond was investigated as a reference to define the origin of field-emitted electrons from lightly nitrogen (N)-doped chemical vapor deposition (CVD) diamond. Using our combined X-ray photoelectron spectroscopy / ultraviolet photoelectron spectroscopy / field emission spectroscopy (XPS/UPS/FES) system, we determined the origin of field-emitted electrons for the natural diamond. The energy level of field-emitted electrons was at valence band maximum (VBM) and the origin of field-emitted electrons was independent of applied voltages. The results suggested the observed shift for FES peak of lightly N-doped CVD diamond is most likely due to the resistance of the diamond bulk. The FES Peak Energy - Emission Current characteristics was best fitted to straight lines, and the resistance of the diamond was consistent with the resistance obtained from the slope. In addition, an attempt was made to define the origin of field-induced electron emission for heavily N-doped CVD diamond. The result suggested a possibility of conduction band minimum (CBM) as an origin of emitted electrons.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
Subtitle of host publicationDiamond Electronics - Fundamentals to Applications II
Pages135-141
Number of pages7
Publication statusPublished - 2008 Nov 13
EventDiamond Electronics - Fundamentals to Applications II - Boston, MA, United States
Duration: 2007 Nov 262007 Nov 30

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1039
ISSN (Print)0272-9172

Other

OtherDiamond Electronics - Fundamentals to Applications II
CountryUnited States
CityBoston, MA
Period07/11/2607/11/30

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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