The Observation of Transient Thin Film Structures During the Femto-Second Laser Ablation Process by Using the Soft X-Ray Laser Probe

N. Hasegawa, M. Nishikino, M. Ishino, N. Ohnishi, A. M. Ito, Y. Minami, M. Baba, A. Ya Faenov, N. Inogamov, T. Kawachi, K. Kondo, T. Suemoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We modified a soft X-ray laser (SXRL) interferometer synchronized with a Ti:sapphire laser to observe a single-shot image of the nanoscale structure dynamics of materials induced by an optical laser pulse. The lateral resolution on the sample surface was improved to 0.7 μm using precise imaging optics. Using this system, we succeeded in observing thin film structures above the solid (or liquid) surface in the femtosecond laser ablation process of metals (Au). The thin film worked as soft X-ray beam splitter. This result shows a thin film was smooth and dense (with a roughness of a few nanometers and near sold density). Furthermore, it gave rise to the possibility of generating novel transient soft X-ray optics.

Original languageEnglish
Title of host publicationX-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers
EditorsTetsuya Kawachi, Sergei V. Bulanov, Hiroyuki Daido, Yoshiaki Kato
PublisherSpringer Science and Business Media, LLC
Pages273-277
Number of pages5
ISBN (Print)9783319730240
DOIs
Publication statusPublished - 2018 Jan 1
Event15th International Conference on X-Ray Lasers, ICXRL 2016 - Nara, Japan
Duration: 2016 May 222016 May 27

Publication series

NameSpringer Proceedings in Physics
Volume202
ISSN (Print)0930-8989
ISSN (Electronic)1867-4941

Other

Other15th International Conference on X-Ray Lasers, ICXRL 2016
CountryJapan
CityNara
Period16/5/2216/5/27

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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