The observation of a transient surface morphology in the femtosecond laser ablation process by using the soft x-ray laser probe

Noboru Hasegawa, Masaharu Nishikino, Takuro Tomita, Naofumi Ohnishi, Atsushi M. Ito, Takashi Eyama, Naoya Kakimoto, Rui Idutsu, Yasuo Minami, Motoyoshi Baba, Anatoly Y. Faenov, Nail A. Inogamov, Tetsuya Kawachi, Mitsuru Yamagiwa, Tohru Suemoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We have improved a soft x-ray laser (SXRL) interferometer synchronized with a Ti:Sapphire laser pulse to observe the single-shot imaging of the nano-scaled structure dynamics of the laser induced materials. By the precise imaging optics and double time fiducial system having been installed, the lateral resolution on the sample surface and the precision of the temporal synchronization between the SXRL and Ti:Sapphire laser pulses were improved to be 700 nm and 2 ps, respectively. By using this system, the initial stage (t < 200 ps) of the ablation process of the Pt surface pumped by 80 fs Ti:Sapphire laser pulse was observed by the comparison between the soft x-ray reflective image and interferogram. We have succeeded in the direct observation of the unique ablation process around the ablation threshold such as the rapid increase of the surface roughness and surface vibration.

Original languageEnglish
Title of host publicationX-Ray Lasers and Coherent X-Ray Sources
Subtitle of host publicationDevelopment and Applications XI
EditorsAnnie Klisnick, Carmen S. Menoni
PublisherSPIE
ISBN (Electronic)9781628417555
DOIs
Publication statusPublished - 2015 Jan 1
EventX-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI Conference - San Diego, United States
Duration: 2015 Aug 122015 Aug 13

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9589
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherX-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI Conference
CountryUnited States
CitySan Diego
Period15/8/1215/8/13

Keywords

  • Ablation dynamics
  • Femto-second laser ablation
  • Pump and probe experiment
  • Soft x-ray interferometer
  • Soft x-ray laser

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Hasegawa, N., Nishikino, M., Tomita, T., Ohnishi, N., Ito, A. M., Eyama, T., Kakimoto, N., Idutsu, R., Minami, Y., Baba, M., Faenov, A. Y., Inogamov, N. A., Kawachi, T., Yamagiwa, M., & Suemoto, T. (2015). The observation of a transient surface morphology in the femtosecond laser ablation process by using the soft x-ray laser probe. In A. Klisnick, & C. S. Menoni (Eds.), X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI [95890A] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9589). SPIE. https://doi.org/10.1117/12.2186744