The influence of NiFe thickness of top-electrode on exchange coupling parameters of IrMn based MTJ

T. Stobiecki, C. G. Kim, C. O. Kim, Y. K. Hu, M. Czapkiewicz, J. Kanak, J. Wrona, M. Tsunoda, Migaku Takahashi

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

MTJs consisting of Ta(5)/Cu(10)/Ta(5)/NiFe(2)/Cu(5)/IrMn(10)/CoFe(2.5)/Al- O/CoFe(2.5)/NiFe(t)/Ta(5), where t = 10, 30, 60 and 100 nm in as-deposited and annealed state were characterized by XRD measurements: in grazing incidence (GID scan-2θ) and θ-2θ geometry, by rocking curve (scan-ω) and pole figures. The improvement of [111] texture and increase of average crystallite size of IrMn3 and Ni80Fe20 layers after annealing in 300°C lead to enhancement of interfacial coupling as well interlayer coupling.

Original languageEnglish
Pages (from-to)e1503-e1505
JournalJournal of Magnetism and Magnetic Materials
Volume272-276
Issue numberSUPPL. 1
DOIs
Publication statusPublished - 2004 May 1

Keywords

  • Interfacial magnetic property
  • Magnetic tunneling junction
  • XRD

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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