MTJs consisting of Ta(5)/Cu(10)/Ta(5)/NiFe(2)/Cu(5)/IrMn(10)/CoFe(2.5)/Al- O/CoFe(2.5)/NiFe(t)/Ta(5), where t = 10, 30, 60 and 100 nm in as-deposited and annealed state were characterized by XRD measurements: in grazing incidence (GID scan-2θ) and θ-2θ geometry, by rocking curve (scan-ω) and pole figures. The improvement of  texture and increase of average crystallite size of IrMn3 and Ni80Fe20 layers after annealing in 300°C lead to enhancement of interfacial coupling as well interlayer coupling.
- Interfacial magnetic property
- Magnetic tunneling junction
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics